Investigations are made on multiple films where the coupling by a copper or chromium intermediate film is used to improve the creep resistivity. Objects of investigations are the structure of the intermediate film, the types of the domain walls, and the coercive force with respect to the intermediate film thicknesses and evaporation conditions. The measurement of the creep properties is carried out on magnetically defined elements. To explain the creep behaviour at different interfilm thicknesses, a model is proposed according to which the bulging of the wall under the action of a field parallel to the wall is a supposition of the creeping.