Line model of creep in cross-tie wall

Otschik, P.

doi:10.1002/pssa.19700030222

Cited by 2 publications

(2 citation statements)

References 10 publications

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“…The value of H , attains a maximum a t the cross Bloch lines. This is in agreement with theorct,ical calculations by Otschik [14]. The buckling increases with increasing Hi1 (Fig.…”

Section: Buckling Of Cross-tie Wallssupporting

confidence: 92%

Lorentz electron microscopic studies on migration of bloch lines and buckling of cross-tie walls

Burger¹

1971

Phys. Stat. Sol. (a)

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Domain wall creeping is connected with Bloch line movement under the influence of a hard‐axis field normal to the wall and with wall buckling under the influence of an easyaxis field parallel to the wall. These two phenomena are investigated separately by Lorentz microscopy. It is found that Bloch line migration along a cross‐tie wall occurs not only by Barkhausen jumps but also steadily over small distances. The smallest distances found between adjacent cross and circle Bloch lines are some 100 Å at transverse fields shortly below wall transition field strength. This transition from cross‐tie wall to Néel wall is marked by mutual neutralization of the Bloch lines which have approached each other. Contrary to the observations of Telesnin et al. and Torok et al. also wall bucklings are found which do not originate from cross Bloch lines and which have no apexes. Only at stronger easy‐axis fields the wall bucklings can become sometimes a zig‐zag line.

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“…The value of H , attains a maximum a t the cross Bloch lines. This is in agreement with theorct,ical calculations by Otschik [14]. The buckling increases with increasing Hi1 (Fig.…”

Section: Buckling Of Cross-tie Wallssupporting

confidence: 92%

Lorentz electron microscopic studies on migration of bloch lines and buckling of cross-tie walls

Burger¹

1971

Phys. Stat. Sol. (a)

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“…The gyromagnetic model of moving Bloch line st,ray fields [4] is in principle unsuitable for low-frequency creep explanation : moreover, stray fields as a function of distance from the circiilar line decrease too rapidly. Otschik [5] has calculated phenomenologically the cross-tie wall R. V. TELESNIN et a].…”

Section: Introductionmentioning

confidence: 99%

Coercivity spectrum and domain wall creep in 200 to 1000 Å permalloy films

Telesnin

Shishkov

Osukhovskii

et al. 1974

Phys. Stat. Sol. (a)

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Investigations of cross‐tie wall deformation under the influence of magnetic field carried out by magnetic suspension have revealed the nonuniform interaction of wall elements with the magnetic film potential relief. The Néel segment coercive field HcN is the less (HcN ≈︁ 0.1 Oe) and that may be explained by the theory of ripple induced coercivity. The cross‐tie coercive field Hct changes with film thickness within the limits of 0.3 to 0.7 Oe (under stray field influence) and reaches its minimum at d ≈︁ 600 Å. Following a decrease in field Hct with thickness the creep kinematics varies due to changes in the effective distance between the wall points fixed at defects. The maximum creep efficiency is shown to be connected not with the greatest cross‐tie density but with the growth of the distance le. The macroscopic coercive field of domain wall motion Hst≈︁1.0 Oe is defined by the nature of separate large imperfections.

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Line model of creep in cross-tie wall

Cited by 2 publications

References 10 publications

Lorentz electron microscopic studies on migration of bloch lines and buckling of cross-tie walls

Lorentz electron microscopic studies on migration of bloch lines and buckling of cross-tie walls

Coercivity spectrum and domain wall creep in 200 to 1000 Å permalloy films

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