Controlled manipulation of molecular samples with the nanoManipulator

Guthold, Martin; Falvo, M. R.; Matthews, William G.; Paulson, Scott; Washburn, S.; Erie, Dorothy A.; Superfine, Richard; Brooks, Frederick P.; Taylor, Russell M.

doi:10.1109/aim.1999.803134

Cited by 37 publications

(29 citation statements)

References 43 publications

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“…In this arena carbon nanotubes (CNT) have produced plethora of applications in nanofabrication, and atomic force microscope (AFM) has been used as manipulating media in recent times for fabrication of nanodevices and biological samples (Bhushan et al 2008;Carpick and Salmeron 1997;Guthold et al 1999Guthold et al , 2000. Scanning-probe microscopy especially AFM (Binnig et al 1986) is an indispensable tool for nanofabrication.…”

Section: Introductionmentioning

confidence: 99%

Atomic force microscope manipulation of multiwalled and single walled carbon nanotubes with reflux and ultrasonic treatments

et al. 2012

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We are reporting the atomic force microscope (AFM) nanomanipulation of ultrasonically dispersed and reflux-oxidized multiwalled carbon nanotubes (MWCNT) and single walled carbon nanotubes (SWCNT) by controlling the AFM tip with a NanoManipulator on a silicon substrate. The structure and the morphology of the carbon nanotubes (CNT) were confirmed with AFM interfaced with NanoManipulator and transmission electron microscope. The modifying parameter, which controls the force exerted by AFM tip, was set to be 0.5 nA in each case (0.5 nA = 20 nN). Bending was observed in ultrasonically dispersed MWCNTs, whereas, cutting was observed for reflux-oxidized MWCNTs along with the lateral movements. Similar observations were found for SWCNTs with sharp cuts and lateral displacements. The results show that CNTs deform by combining bending and distortion when subjected to large mechanical forces exerted by the tip of the AFM. The magnitude of the force, required to deform the reflux-oxidized CNTs is less than that for the ultrasonically dispersed CNTs, for both MWCNTs and SWCNTs.

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Section: Introductionmentioning

confidence: 99%

Atomic force microscope manipulation of multiwalled and single walled carbon nanotubes with reflux and ultrasonic treatments

et al. 2012

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“…The lack of real-time visual feedback makes the AFM-based nanomanipulation inefficient. In the most recently available AFM-based nanomanipulation systems, the manipulation path is planned either manually by a haptic device [3], [9] or through a software interface such as in Requicha's system [10] and the Nanoman system, a product of Veeco Inc. (now Bruker). Because there is no visual feedback information to update the manipulation results in real-time, a new image scanning is required after each basic operation to check the result in order to plan next operation.…”

Section: Augmented Reality System and Local Scanmentioning

confidence: 99%

“…In addition to the imaging mode, an operator can command the motion of the AFM tip in an arbitrary manner, thus to manipulate nanoscale objects with nanoscale precision. Since the first try using AFM to manipulate nano-objects [2], many research groups have been working on AFM-based nanomanipulation [3]- [7]. Tasks such as pushing, pulling, cutting, bending, kinking, rolling, and sliding have been reported in the literature [3]- [6], [8]- [10].…”

Section: Introductionmentioning

confidence: 99%

Drift Compensation in AFM-Based Nanomanipulation by Strategic Local Scan

Wang

Liu

2012

IEEE Trans. Automat. Sci. Eng.

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Abstract-The drift distorts the atomic force microscopy (AFM) images as the time taken to acquire a complete AFM image is relatively long (a few minutes). As the AFM image is used as a reference for most manipulation mechanisms, the image distorted by drift will cause problems for AFM-based manipulation because the displayed positions of the objects under nanomanipulation do not match their actual locations. The drift during manipulation, similarly, will further exacerbate the mismatch between the displayed positions and the actual locations. Such mismatch is a major hurdle to achieve automation in AFM-based nanomanipulation. Without proper compensation, manipulation based on a wrong displayed location of the object often fails. In this paper, we present an algorithm to identify and eliminate the drift-induced distortion in the AFM image by applying a strategic local scan method. Briefly, after an AFM image is captured, the entire image is divided into several parts along vertical direction. A quick local scan is performed in each part of the image to measure the drift value in that very part. In this manner, the drift value is calculated in a small local area instead of the global image. Thus, the drift can be more precisely estimated and the actual position of the objects can be more accurately identified. In this paper, we also present the strategy to constantly compensate the drift during manipulation. By applying local scan on a single fixed feature in the AFM image frequently, the most current positions of all objects can be displayed in the augmented reality for real-time visual feedback.Notes to Practitioners-Fabrication of nanoscale devices by AFM-based manipulation has attracted much attention recently. However, it is a sequential approach and therefore the throughput is low. To increase the efficiency of AFM-based nanomanipulation, automation is considered to be the ultimate solution. Unfortunately, automation in AFM-based nanomanipulation is facing several technical hurdles. The thermal drift is one of them. Because of the presence of thermal expansion and contraction, the relative position between the tip and the sample undergoes drift with respect to time. Therefore, the AFM images are often distorted due to the thermal drift because the time taken to acquire a complete AFM image is in the range of minutes. This paper tries to tackle this problem by compensating the thermal drift through direct measurement of the thermal drift by local scan. The direct measurement not only can be used to correct Manuscript received December 07, 2011; revised June 14, 2012; accepted July 20, 2012 the drift-induced distortion in the initial AFM image, it can also be used to compensate the real-time drift during manipulation. Starting from a drift-clean image at the beginning and with drift being compensated in real-time during manipulation, the AFM-based nanomanipulation can be more accurate and efficient. The research results here is one of the important steps to achieve full automation in AFM-based nanomanipulation.

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“…To enhance the efficiency of AFM based manipulation, some virtual reality based methods have been developed. A 3-D virtual reality visual feedback is built from the static AFM image in Sitti (1998) and Guthold (2000). AlthOl昭1 a virtual r巳ality can display a static virtual environment and a dynamic tip position, it does not display the environment cha丑ges during manipulation.…”

Section: Ntroductionmentioning

confidence: 99%