“…The disadvantage of this technique is that it is destructive, requires careful sample preparation and is restricted to very small areas of the sample. Recently, white-beam X-ray diffraction topography using synchrotron radiation sources turned out to be a simple, fast and ef®cient imaging technique for the investigation of domain structures (Yao et al, 1991;Huang et al, 1996;Medrano et al, 1999;Chikaura et al, 2001). Information regarding twin laws and twin distribution can be simultaneously obtained from a large area of the specimen.…”