“…The experimental set-up mainly consisted of an X-ray microbeam source, a tensile sample stage, a flat panel detector, and a Ge solid state detector (SSD), as reported previously. 41,42) In order to analyze the stress distribution in the sample under unloading after plastic deformation and under subsequent tensile loading, the Laue diffraction patterns were recorded for a sample unloaded after about 10% tensile deformation and for a sample loaded after subsequently being subjected to about 13% tensile deformation, as illustrated in Fig. 2.…”