Development of visualization method of grain boundaries in stainless steel by using white X‐ray micro‐beam and image detector

Abstract

A visualization method of grain boundaries in a polycrystal was developed at BL28B2 in SPring‐8. By combining a scanning type white X‐ray micro‐diffraction system with high‐energy synchrotron X‐rays we non‐destructively obtained images to visualize grain boundaries and grains in stainless steel by simple data processing. The images were comparable to those obtained by electron back scattering pattern technique. It was shown that the new method can be applied to bulky plate sample as thick as 300 µm containing grains with size of 100 µm.

Characterization of Evolution of Microscopic Stress and Strain in High-Manganese Twinning-Induced Plasticity Steel

“…[34][35][36][37][38][39] White X-ray diffraction method with microbeam synchrotron radiation has been also applied to observe the microstructure and to analyze the microscopic stress in steels. 40,41) This method has been employed to analyze the microscopic stresses evolved in the microstructure of iron-based shape memory alloys. The analysis showed that characteristic microscopic stresses are evolved by tensile deformation at room temperature and by subsequent annealing.…”

“…The sample was deformed using a compact tensile machine for in-situ deformation. 40,41) The nominal tensile strain was measured from the displacement of marks indented on the tensile sample using an optical microscope. In white X-ray diffraction by in-situ tensile deformation, the applied load was measured using a load cell attached to the sample grip.…”

“…By comparing these diffraction patterns numerically, we could obtain the grain images. 40) The value of d hkl was calculated from the obtained energy E hkl according to Bragg's law. 41) The value of ε hkl was calculated from the difference between the lattice spacing d hkl measured after deformation and the initial lattice spacing d 0 hkl .…”

<i>In-Situ</i> Measurement of Internal Stress Distribution Change of TT600 by Energy-Dispersive X-ray Diffraction with White X-ray Micro Beam

“…9) However, as the depth detection by the EBSD method is limited only to surfaces with a depth of several nanometers, the strain distribution inside materials has not been evaluated. The EXDM method 7) has been Table 1 Chemical composition of specimens (mass%).…”

Characterization of Deformation Behavior of Individual Grains in Polycrystalline Cu-Al-Mn Superelastic Alloy Using White X-ray Microbeam Diffraction

“…Prior to the strain/stress measurements, the grain image of the sample was obtained by performing X-ray microbeam diffraction experiments in scanning mode. Details of the visualization method are given in [7]. Then, the measurement positions were chosen using the obtained grain image.…”