2005
DOI: 10.1002/adfm.200400575
|View full text |Cite
|
Sign up to set email alerts
|

Conductive SU8 Photoresist for Microfabrication

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

2
66
0

Year Published

2007
2007
2015
2015

Publication Types

Select...
7
2

Relationship

0
9

Authors

Journals

citations
Cited by 84 publications
(70 citation statements)
references
References 23 publications
2
66
0
Order By: Relevance
“…Increasing the amount of the conductive filler reduces the electrical resistivity of the PDMS composite matrix by adding more interconnected clusters of silver particles into conducting paths. [33,34] Therefore, as shown in Figure 5, we have experimentally observed that a sudden decrease of electrical resistivity occurs at a percolation threshold around 18 vol %, compared with the theoretical prediction of 16 vol % (assuming a simple binary composite with spherical particles distributed statistically). [35,36] Here, we attribute the 2% variation from the theoretical prediction to the non-ideal shape and size distribution of the silver clusters.…”
Section: Electrical Conductivitymentioning
confidence: 91%
“…Increasing the amount of the conductive filler reduces the electrical resistivity of the PDMS composite matrix by adding more interconnected clusters of silver particles into conducting paths. [33,34] Therefore, as shown in Figure 5, we have experimentally observed that a sudden decrease of electrical resistivity occurs at a percolation threshold around 18 vol %, compared with the theoretical prediction of 16 vol % (assuming a simple binary composite with spherical particles distributed statistically). [35,36] Here, we attribute the 2% variation from the theoretical prediction to the non-ideal shape and size distribution of the silver clusters.…”
Section: Electrical Conductivitymentioning
confidence: 91%
“…At present, the unoptimized conducting polymer composite demonstrates a large contact resistance with the embedded Si micropillars compared to that of metal-Si ohmic contacts [74], [75] due to inefficient electron exchanges between semiconductor and electron/hole-transporting polymers [76]. Efforts are currently underway to decrease the contact resistance by optimizing the conducting polymer-metal composite and forming a thermoplastic metal nanoparticle conducting polymer [77].…”
Section: Resultsmentioning
confidence: 99%
“…The photo curing kinetics of SU-8 with and without silica nanoparticles have been studied [100]. The SU-8 was made conductive by addition of silver nanoparticles [101] and ferromagnetic by addition of nickel nanospheres [28]. Refractive index was changed by adding a liquid aliphatic resin [29].…”
Section: Bulk Modificationmentioning
confidence: 99%