“…It has also been developed for radiation-hardened applications due to single event upset immunity, which benefits from fully dielectric isolation of shallow trench isolation (STI) and buried oxide (BOX) [1,2]. However, the thick buried oxide induces more complicated total ionizing dose (TID) effect, which has been studied in numerous papers [3,4,5,6,7,8,9,10,11]. With the scale decreasing, the short channel effects emerge [12,13].…”