2012
DOI: 10.1109/tcpmt.2012.2197859
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Competing Fracture Modeling of Thin Chip Pick-Up Process

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Cited by 30 publications
(5 citation statements)
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“…5(b), respectively, where the geometrical parameters are fixed at l chip = 8 mm and l substrate /l chip = 1.5. Here, from the figures, it is observed that the agreement between analytical predictions by (7) and Finite Element (FE) results, not only with regard to their trends, but also from a quantitative viewpoint, is surprisingly very good. Further, it should be pointed out that the die cracking stress vanishes gradually when it gets close to the free end.…”
Section: B Effects Of Crack Length and Distance Between Adjacent Neementioning
confidence: 71%
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“…5(b), respectively, where the geometrical parameters are fixed at l chip = 8 mm and l substrate /l chip = 1.5. Here, from the figures, it is observed that the agreement between analytical predictions by (7) and Finite Element (FE) results, not only with regard to their trends, but also from a quantitative viewpoint, is surprisingly very good. Further, it should be pointed out that the die cracking stress vanishes gradually when it gets close to the free end.…”
Section: B Effects Of Crack Length and Distance Between Adjacent Neementioning
confidence: 71%
“…The answer to the peeling mechanism and failure essence for this single-needle technology had been made by the authors based on the fracture mechanics theory [14], [15], where it had been indicated that the peeling energy release rate (ERR) decreases as the chips become more thinner and larger, namely harder to peel chip off. Further, they pointed out that there was a competing relationship between chip peeling-off and chip cracking, and the design rules of the process window were to enhance the peeling ERR and restrain cracking stress of the chip [7]. A practicable and effective way may be to penetrate more needles below the adhesive tape to more safely lift a thin/ultrathin die.…”
mentioning
confidence: 99%
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“…These undesired phenomena are induced by the force of the ejector pin, the relative movement of the pickup head, and the requirement for high-speed placement. Owing to the rapid growth of the flexible electronics market, Yin's research group at HUST proposed a competitive index quantitative evaluation method for chip peel ability [40][41][42]. The competitive behaviors of chip stripping and fracture and their influencing mechanisms were revealed.…”
Section: Flip Chip Technologymentioning
confidence: 99%
“…[ 15–21 ] The key in assembly process is to regulate interfacial adhesion states between strong for pick‐up and weak for printing in a robust and repeatable manner. Conventional pick‐and‐place technique, [ 22–26 ] which utilizes a small vacuum chunk to pick up and release the chip, has shown excellent performance in controlling the interfacial adhesion. [ 22 ] However, the scaling of the vacuum system down for chips with a lateral dimension smaller than 80 µm and a thickness thinner than 50 µm still remains a great challenge.…”
Section: Introductionmentioning
confidence: 99%