Comparison of Vector Network Analyser (VNA) calibration techniques at microwave frequencies

Uncertainties in Small-Signal and Large-Signal Measurements of RF Amplifiers Using a VNA

“…The amplifier operating in linear mode can be evaluated with S-parameter measurements. However, for evaluation of the measurement uncertainty, the methods used in [10] - [13] can fail when the parameters of the DUT can change due to DC supply, thermal self-heating, changes in active junction regions, electromagnetic influence due to proximity, environmental changes, etc. Tools such as VNA-DUO which are pre-characterized for uncertainty are more suitable for such measurements.…”

“…Both small-signal and large-signal parameters of an amplifier are considered. To evaluate the measurement uncertainty in S-parameters at RF frequencies, software tools such as VNA Tools [11], MUF [12], PIMMS [13], and FAME [14] are used at National Metrology Institutes (NMIs) around the world. VNA-DUO can evaluate the measurement uncertainty in S-parameters and power in real-time once the sources of uncertainty in the VNA and power meter have been fully characterized.…”