Microelectronics Reliability
 2020
DOI: 10.1016/j.microrel.2019.113547
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Comparing the TID-induced RF performance degradation of floating body and body contacted 130 nm SOI NMOS transistors

Hao Ge
1
,
En Xia Zhang
2
,
Jing Chen
3
et al.
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Cited by 3 publications
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The impact of total ionizing dose on RF performance of 130 nm PD SOI I/O nMOSFETs

Xie
1
,
Ge
2
,
Lv
3
et al. 2021
Microelectronics Reliability
2
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The impact of total ionizing dose on RF performance of 130 nm PD SOI I/O nMOSFETs

Xie
1
,
Ge
2
,
Lv
3
et al. 2021
Microelectronics Reliability
2
0
0
0
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Synergistic effect of total ionizing dose and electromagnetic interference in current reference circuits using scaling-down SOI technologies

Wang1,
Wu
2
,
Li
3
et al. 2022
2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)
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Space Tags: Ultra-Low-Power Operation and Radiation Hardness for Passive Wireless Sensor Tags

Grosinger
1
,
Michalowska-Forsyth
2
2022
IEEE Microwave
6
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4
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