Synergistic effect of total ionizing dose and electromagnetic interference in current reference circuits using scaling-down SOI technologies

Wang, Z.; Wu, Jianfei; Li, B.; Zhang, H.; Zhao, Xingang; Li, J.; Zhao, W. R.; Ye, T.

doi:10.1109/apemc53576.2022.9888663

2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) 2022

DOI: 10.1109/apemc53576.2022.9888663

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Synergistic effect of total ionizing dose and electromagnetic interference in current reference circuits using scaling-down SOI technologies

Z. Wang¹,

Jianfei Wu

B. Li

et al.

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Synergistic effect of total ionizing dose and electromagnetic interference in current reference circuits using scaling-down SOI technologies

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References 7 publications

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