Comparing Raman mapping and electron microscopy for characterizing compositional gradients in thermoelectric materials

Yasseri, Mohammad; Schüpfer, Dominique; Weinhold, Marcel; Chen, Limei; Kamila, Hasbuna; Müller, Eckhard; Boor, Johannes de; Klar, Peter J.

doi:10.1016/j.scriptamat.2020.01.002

Cited by 6 publications

(2 citation statements)

References 28 publications

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“…7 The risk of individual components masking other components with less intense Raman spectra can be a limitation when using multivariate analysis. 4 The different approaches for obtaining microstructural information from confocal Raman microscopy have been applied to study materials in multiple disciplines including engineering, 8 medicine, 9 soft matter, 10 among others. In food, dairy systems have been widely studied with Raman microscopy, for both label-free identification of components in a cheese matrix, 11 including distinguishing of whey protein particles within the casein protein matrix, 2 and for detection of microstructural changes.…”

Section: Introductionmentioning

confidence: 99%

Confocal Raman microscopy to evaluate anisotropic structures and hydration development. Methodological considerations

et al. 2023

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Section: Introductionmentioning

confidence: 99%

Confocal Raman microscopy to evaluate anisotropic structures and hydration development. Methodological considerations

et al. 2023

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“…At present, the mapping technology of photoluminescence (PL) and Raman scattering has achieved high sensitivity for even single-molecule detection and nice submicrometer spatial resolution. The Raman scattering mappings allow analysis of local inhomogeneity, such as the distribution of materials, − the distribution of carriers, defects and dislocations, and thickness . Nevertheless, it would be difficult to determine the origin and mechanism by only using one type of spectroscopy for the limitation of simultaneous information.…”

Section: Introductionmentioning

confidence: 99%

Spatial Identification of “Zeroth Defect” Formation in Organic Light-Emitting Diodes by Multispectral Mappings

Lin

Zhou

Hou

et al. 2022

ACS Appl. Mater. Interfaces

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In recently developed organic semiconductors, the continuously improving sample purity makes the stability of the chemical bonds of organic materials themselves become a key factor in device stability, which provides greater uncertainty for the generation of “zeroth defect”, and the spatial resolution of performance at different positions becomes particularly important. In this work, complete maps of electroluminescent, photoluminescent, and Raman scattering in the same area on an organic light-emitting diode during its operation have been achieved with a confocal spectrometer with multiple laser sources. The different spectral characters help to establish different regions and suggest the mechanism of degradation. In particular, Raman scattering has been shown to be very sensitive in a multilayer device to a change in thickness of several nanometers. In amorphous films with few defects, the very weak film uniformity, including the thickness and degree of aggregation, would induce dramatic degradation. The relatively thin and/or loosely textured region easily locally overheats and has the highest probability of “zeroth defect” generation. This method has high spatial resolution, a low level of damage to samples, good reproducibility, and multiple interconnected pieces of information, which is significant for online quality prediction and mechanistic analysis.

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Mapping the residual strain of carbon nanotubes in DWCNT/epoxy nanocomposites after tensile load using Raman microscopy

Laurenzi

Botti

Rufoloni

2020

Composites Communications

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Comparing Raman mapping and electron microscopy for characterizing compositional gradients in thermoelectric materials

Cited by 6 publications

References 28 publications

Confocal Raman microscopy to evaluate anisotropic structures and hydration development. Methodological considerations

Confocal Raman microscopy to evaluate anisotropic structures and hydration development. Methodological considerations

Spatial Identification of “Zeroth Defect” Formation in Organic Light-Emitting Diodes by Multispectral Mappings

Mapping the residual strain of carbon nanotubes in DWCNT/epoxy nanocomposites after tensile load using Raman microscopy

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