2009
DOI: 10.1002/pssc.200880954
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Comparative cathodoluminescence characterization of ultrathin InN wells/GaN matrix MQWs grown on bulk‐GaN and MOVPE‐GaN

Abstract: One monolayer (1 ML) InN/GaN multiple quantum wells (MQWs) grown on bulk‐GaN and MOVPE‐GaN/ sapphire substrates with threading dislocation densities (TDDs) of about 106 cm–2 and 108 cm–2, respectively, were characterized by SEM‐CL measurements to study the effects of TDs on structural quality of InN/GaN MQWs. For the sample grown on bulk‐GaN substrate, step‐flow surface morphology and quite uniform spatial emission were observed as compared to the sample grown on MOVPE‐GaN/sapphire. CL peak energy at 86 K was … Show more

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