Commissioning of a VNA dynamic uncertainty tool for microwave S-parameter measurements

Uncertainties in Small-Signal and Large-Signal Measurements of RF Amplifiers Using a VNA

“…Tools such as VNA-DUO which are pre-characterized for uncertainty are more suitable for such measurements. For S-parameter measurements, VNA-DUO considers three sources of uncertainty [15]: (i) noise in the VNA (noise floor and trace noise); (ii) cable and connector repeatability; and (iii) the calibration kit. These sources of uncertainty are characterized before the measurement of the DUT and then the corrected S-parameters of the DUT together with their uncertainties are evaluated and displayed on the VNA screen in realtime.…”

“…These sources of uncertainty are characterized before the measurement of the DUT and then the corrected S-parameters of the DUT together with their uncertainties are evaluated and displayed on the VNA screen in realtime. A detailed study of VNA-DUO has been reported in [15]. Small-signal amplifier parameters, such as the input and output return losses, small-signal gain, and reverse isolation, together with their uncertainties can be measured using VNA-DUO.…”

“…The measurement uncertainties are evaluated within the VNA and are displayed as error bars or elliptical uncertainty regions on the VNA screen. VNA-DUO has recently been commissioned for use at the UK's National Physical Laboratory (NPL) [15]. An amplifier's small-signal parameters (which characterize its linear behavior in response to a small-signal stimulus) such as input return loss, output return loss, small-signal gain, and © 2022.…”