Polycrystalline permalloy nanowires with different widths were studied by means of a Lorentz microscope associated with micro-magnetic simulations. Each nanowire was designed to create a single head-to-head transverse domain wall. Edge defects at the long edges of those nanowires were incrementally controlled. Therein, a single pixel at different positions along the nanowire edges was removed. The horizontal nanowires were rotated with different angles, i.e. +/-5o, +/-10o, +/-30o and +/-45o, to produce a certain level of the edge roughness. Some curved nanowires with different widths were also designed, simulated and patterned. Lorentz images of those curved nanowires were recorded. The asymmetric levels of such created walls were measured and correlated to our wall phase diagram. The obtained results showed that the edge defects created along either side of a nanowire strongly induces the asymmetric level of a transverse domain wall.