Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Maryon, Olivia O.; Efaw, Corey M.; DelRio, Frank W.; Graugnard, Elton; Hurley, Michael F.; Davis, Paul H.

doi:10.3791/64102

Cited by 3 publications

(3 citation statements)

References 17 publications

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“…Probe microscopy KPFM By compensating or minimizing the electrostatic force between the probe and the sample [84] Non-destructive/ Nanoscale resolution/ Direct measurement of surface potential changes caused by charges [149] Probe needs calibration/ Affected by test environment and sample surface condition [150] EFM By measuring the electrostatic force between the tip and the sample [95] Nanoscale resolution/ Ultra-high precision [151] control can be achieved by combining the multi-channel function generator.…”

Section: Acoustic Methodsmentioning

confidence: 99%

“…The resolution of KPFM surface potential measurements can be influenced by several factors, including probe geometry, material, parasitic effects (e.g., capacitive coupling), sample surface conditions, and test environment. [ 150 ] To achieve accurate surface potential measurements, researchers have implemented various improvements: 1) Calibration methods can be used to determine precise tip work functions. For instance, multiple linear fitting of the contact potential difference between the sample and the tip can reduce the uncertainty of the tip work function.…”

Section: Experimental Techniques Of Interface Chargesmentioning

confidence: 99%

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Interface Charge Characteristics in Polymer Dielectric Contacts: Analysis of Acoustic Approach and Probe Microscopy

Wang

et al. 2023

Adv Materials Inter

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Interfaces are essential components in polymer contact systems, which widely exist in electronic devices and power equipment. Interface charge originating from the mismatch of the electronic structure in interfaces is one of the key issues to modify the device performance due to its multifunctional migration and accumulation behaviors. Hence, the detection and analysis of the interface charge characteristics are of great importance to deeply understand the polymer contact system in various devices. This paper presents an overview of recent research progress in the interface charge properties at dielectric interfaces. Based on the theoretical analysis of the MWS polarization and electronic localized states, two typical approaches of discussing the interface charges from micrometer to millimeter are mainly studied. Acoustic method is prevalent in detecting the space charge in various dielectrics. However, owing to its limited resolution (several µm), it is difficult to clarify the charge distributions at the interface with a micro‐scale. Probe microscopy presents a promising technique due to its flexible surface potential detection at a submicron scale. The challenges and prospects of acoustic and probe microscopy methods are discussed in this paper. The advanced techniques of interface charges can promote the development of new energy electronic devices.

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Section: Acoustic Methodsmentioning

confidence: 99%

Section: Experimental Techniques Of Interface Chargesmentioning

confidence: 99%

Interface Charge Characteristics in Polymer Dielectric Contacts: Analysis of Acoustic Approach and Probe Microscopy

Wang

et al. 2023

Adv Materials Inter

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“…To ascertain whether the identified domains originate from distinct crystalline orientations, a combined approach employing EBSD mapping and KPFM measurements is adopted for simultaneous topographical, electronic, and microstructural imaging of the ITO surface on the same point of interest (POI). This is schematically represented in Figure 3 a (details on the protocol procedure 50 in the SI ).…”

Section: Methodsmentioning

confidence: 99%

Impact of the TCO Microstructure on the Electronic Properties of Carbazole-Based Self-Assembled Monolayers

Kralj,

Dally,

Bampoulis

et al. 2023

ACS Materials Lett.

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Carbazole-based self-assembled monolayers (PACz-SAMs), anchored via their phosphonic acid group on a transparent conductive oxide (TCO), have demonstrated excellent performance as hole-selective layers in perovskite/ silicon tandem solar cells. Yet, whereas different PACz-SAMs have been explored, the role of the TCO, and specifically its microstructure, on the hole transport properties of the TCO/ PACz-SAMs stack has been largely overlooked. Here, we demonstrate that the TCO microstructure directly impacts the work function (WF) shift after SAM anchoring and is responsible for WF variations at the micro/nanoscale. Specifically, we studied Sn-doped In 2 O 3 (ITO) substrates with amorphous and polycrystalline (featuring either nanoscale-or microscale-sized grains) microstructures before and after 2PACz-SAMs and NiO x /2PACz-SAMs anchoring. With this, we established a direct correlation between the ITO crystal grain orientation and 2PACz-SAMs local potential distribution, i.e., the WF. Importantly, these variations vanish for amorphous oxides (either in the form of amorphous ITO or when adding an amorphous NiO x buffer layer), where a homogeneous surface potential distribution is found. These findings highlight the importance of TCO microstructure tuning, to enable both high mobility and broadband transparent electrodes while ensuring uniform WF distribution upon application of hole transport SAMs, both critical for enhanced device performance.

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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Enrriques

Howard

Timsina

et al. 2022

JoVE

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Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Cited by 3 publications

References 17 publications

Interface Charge Characteristics in Polymer Dielectric Contacts: Analysis of Acoustic Approach and Probe Microscopy

Interface Charge Characteristics in Polymer Dielectric Contacts: Analysis of Acoustic Approach and Probe Microscopy

Impact of the TCO Microstructure on the Electronic Properties of Carbazole-Based Self-Assembled Monolayers

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

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