1993
DOI: 10.1016/0925-4005(93)85234-2
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Chemical and biochemical sensors based on interferometry at thin (multi-) layers

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Cited by 204 publications
(139 citation statements)
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“…Spectral reflectance at near normal incidence is a wellestablished technique for in situ characterisation of thin metallic [68] or polymer [69] films. Here we expand this method by performing spectral reflectance measurements with a microscope: we thus obtain a diffraction-limited lateral resolution instead of an averaged measurement on a surface, opening the way to sub-micron mapping of thin layer heterogeneities.…”
Section: Spectral Reflectance Measurementsmentioning
confidence: 99%
“…Spectral reflectance at near normal incidence is a wellestablished technique for in situ characterisation of thin metallic [68] or polymer [69] films. Here we expand this method by performing spectral reflectance measurements with a microscope: we thus obtain a diffraction-limited lateral resolution instead of an averaged measurement on a surface, opening the way to sub-micron mapping of thin layer heterogeneities.…”
Section: Spectral Reflectance Measurementsmentioning
confidence: 99%
“…Next, we used reflectometric interference spectroscopy to measure PtdIns3P binding quantitatively (33,34). In these experiments, silicon wafers with an oxide layer sufficiently thick for interference fringes were incubated with small unilamellar vesicles composed of 1,2-dioleoyl-sn-glycero-3-phosphatidylcholine (DOPC) and 3% PtdIns3P.…”
Section: Requirement Of Both Binding Sites For Effective Phosphoinosimentioning
confidence: 99%
“…Spectral interferometry has been used as an feasible approach to detect changes in optical path length in thin films from immunoreactions [104]. Thin films were fixed to a glass substrate which located at the end of a bifurcated optical fiber.…”
Section: Sensing Schemesmentioning
confidence: 99%