The 13th International Conference on Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDU
DOI: 10.1109/sensor.2005.1497499
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Characterization of vertical vibration of electrostatically actuated resonators using atomic force microscope in noncontact mode

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Cited by 8 publications
(7 citation statements)
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“…Here, the offset slit electrodes increase the operational range of the devices, which is usually limited by the pullin instability. Resonant operation of a nanoscale cantilever using fringing fields, provided by two symmetric electrodes fabricated using the same layer as the beam, was demonstrated in [37]. Parametric excitation of cantilever and double-clamped beams by the fringing fields in a single layer device and in absence of a substrate was demonstrated theoretically and experimentally in [38].…”
Section: Introductionmentioning
confidence: 99%
“…Here, the offset slit electrodes increase the operational range of the devices, which is usually limited by the pullin instability. Resonant operation of a nanoscale cantilever using fringing fields, provided by two symmetric electrodes fabricated using the same layer as the beam, was demonstrated in [37]. Parametric excitation of cantilever and double-clamped beams by the fringing fields in a single layer device and in absence of a substrate was demonstrated theoretically and experimentally in [38].…”
Section: Introductionmentioning
confidence: 99%
“…How can we verify that the amplitude detected is due to a large movement of the SMR surface or a dynamic influence of the liquid? A more straightforward experiment is conducted with a “single-frequency method” [ 14 , 21 ] in tapping mode in fluid. The idea of vibration amplitude measurement is shown in Figure 4 a.…”
Section: Experimental Results and Analysismentioning
confidence: 99%
“…The fundamental resonance mode was found to be 2.75 MHz with a quality factor of 6 and the peak amplitude is ~230 nm [ 13 ]. Two years later, a simple and direct method based on AFM operating in tapping mode was demonstrated to characterize the vibration amplitude of electrostatically-actuated MEMS resonators with the resonant frequency of 6.35 MHz and the corresponding amplitude of 90 nm [ 14 ]. The above two methods are suitable for a relatively stronger vibration, i.e., generally larger than 20 nm.…”
Section: Introductionmentioning
confidence: 99%
“…It is worth to mention that actuators relying on electric fringingfields were previously used as resonant tilting micro devices [12,29,30] especially for scanning applications, non-contact mode Atomic Force Microscope (AFM) [31], and Scanning Electrostatic Force Microscopy (SEFM) [32]. Non-contact offset slits electrostatic microactuator configuration, where a mobile slit were located at a certain offset from two stationary electrodes, was presented in Refs.…”
Section: Introductionmentioning
confidence: 99%