Characterization of the Percival detector with soft X-rays

Marras, A.; Correa, Jonathan; Lange, S.; Vardanyan, V. V.; Gerhardt, Tim; Kuhn, Manuela; Kriváň, F.; Shevyakov, I.; Zimmer, M.; Hoesch, Moritz; Bagschik, Kai; Scholz, Frank; Guerrini, N.; Marsh, B.; Sedgwick, I.; Cautero, G.; Giuressi, D.; Iztok, Gregori; Menk, R. H.; Scarcia, Martin; Stebel, L.; Nicholls, T.; Nichols, William F.; Pedersen, U.; Shikhaliev, Polad M.; Tartoni, N.; Hyun, H.J.; Kim, SeongHan; Kim, KyungSook; Rah, Seungyu; Dawiec, A.; Orsini, F.; Pinaroli, G.; Greer, A.L.; Aplin, S.; Jewell, April D.; Jones, Todd J.; Nikzad, Shouleh; Hoenk, Michael E.; Okrent, Frank; Graafsma, H.; Wunderer, C.

doi:10.1107/s1600577520013958

Cited by 14 publications

(11 citation statements)

References 16 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…It has been shown that these sensors dramatically increase the full-frame acquisition speed (48 Hz for the standard gain and 24 Hz for the HDR mode) compared to the commercial Back-Side-Illuminated Charge-Coupled Device (CCD-BSI) routinely used at soft X-ray facilities. The first utilization of this device opened up perspectives for soft X-ray ptychography (Mille et al, 2022), soft X-ray scattering techniques (Desjardins et al, 2020;Marras et al, 2021) and other applications, such as soft X-ray fluorescence (Staeck et al, 2021). Another obvious application concerns the implementation of such a class of detectors at ultra-short X-ray sources (laser-based X-ray source or free-electron laser), where the low frame rate of the standard commercially available CCD-BSI (see, for example, Vodungbo et al, 2012;Wang et al, 2012) limits the time of data collection.…”

Section: Introductionmentioning

confidence: 99%

Single-shot experiments at the soft X-FEL FERMI using a back-side-illuminated scientific CMOS detector

Léveillé¹,

Desjardins²,

Popescu³

et al. 2022

J Synchrotron Radiat

View full text Add to dashboard Cite

The latest Complementary Metal Oxide Semiconductor (CMOS) 2D sensors now rival the performance of state-of-the-art photon detectors for optical application, combining a high-frame-rate speed with a wide dynamic range. While the advent of high-repetition-rate hard X-ray free-electron lasers (FELs) has boosted the development of complex large-area fast CCD detectors in the extreme ultraviolet (EUV) and soft X-ray domains, scientists lacked such high-performance 2D detectors, principally due to the very poor efficiency limited by the sensor processing. Recently, a new generation of large back-side-illuminated scientific CMOS sensors (CMOS-BSI) has been developed and commercialized. One of these cost-efficient and competitive sensors, the GSENSE400BSI, has been implemented and characterized, and the proof of concept has been carried out at a synchrotron or laser-based X-ray source. In this article, we explore the feasibility of single-shot ultra-fast experiments at FEL sources operating in the EUV/soft X-ray regime with an AXIS-SXR camera equipped with the GSENSE400BSI-TVISB sensor. We illustrate the detector capabilities by performing a soft X-ray magnetic scattering experiment at the DiProi end-station of the FERMI FEL. These measurements show the possibility of integrating this camera for collecting single-shot images at the 50 Hz operation mode of FERMI with a cropped image size of 700 × 700 pixels. The efficiency of the sensor at a working photon energy of 58 eV and the linearity over the large FEL intensity have been verified. Moreover, on-the-fly time-resolved single-shot X-ray resonant magnetic scattering imaging from prototype Co/Pt multilayer films has been carried out with a time collection gain of 30 compared to the classical start-and-stop acquisition method performed with the conventional CCD-BSI detector available at the end-station.

show abstract

Section: Introductionmentioning

confidence: 99%

Single-shot experiments at the soft X-FEL FERMI using a back-side-illuminated scientific CMOS detector

Léveillé¹,

Desjardins²,

Popescu³

et al. 2022

J Synchrotron Radiat

View full text Add to dashboard Cite

show abstract

“…As mentioned in Section 1, the PERCIVAL system is in its final development phase. Its capabilities at the time of the experiments in summer/fall 2020 have already been described elsewhere (Marras et al, 2021). The larger dynamic range of the PERCIVAL sensor, and its large active area compared with other detectors, permit the user to register much higher q values, carrying more high-frequency information, which is key to achieve higher spatial resolutions.…”

Section: Discussionmentioning

confidence: 99%

The PERCIVAL detector: first user experiments

Correa¹,

Mehrjoo²,

Battistelli³

et al. 2023

J Synchrotron Radiat

Self Cite

View full text Add to dashboard Cite

The PERCIVAL detector is a CMOS imager designed for the soft X-ray regime at photon sources. Although still in its final development phase, it has recently seen its first user experiments: ptychography at a free-electron laser, holographic imaging at a storage ring and preliminary tests on X-ray photon correlation spectroscopy. The detector performed remarkably well in terms of spatial resolution achievable in the sample plane, owing to its small pixel size, large active area and very large dynamic range; but also in terms of its frame rate, which is significantly faster than traditional CCDs. In particular, it is the combination of these features which makes PERCIVAL an attractive option for soft X-ray science.

show abstract

“…However, the sensitivity of ptychography to variations of the sample thickness is independent of the treatment energy and defined by the refractive index of the sample. The spatial resolution of the ptychography technique is determined by the highest scattering angle detected [50]. Moreover, the sensitivity of ptychography can be further increased by switching to a reflective geometry, potentially achieving sub-nm profile sensitivity with nm spatial resolution [51,52].…”

Section: Discussionmentioning

confidence: 99%

X-ray Ptychographic Imaging and Spectroscopic Studies of Plasma-Treated Plastic Films

Ravandeh

Mehrjoo²,

Kharitonov³

et al. 2022

Polymers

View full text Add to dashboard Cite

Polyethylene terephthalate (PET) is a thermoplastic polyester with numerous applications in industry. However, it requires surface modification on an industrial scale for printing and coating processes and plasma treatment is one of the most commonly used techniques to increase the hydrophilicity of the PET films. Systematic improvement of the surface modification by adaption of the plasma process can be aided by a comprehensive understanding of the surface morphology and chemistry. However, imaging large surface areas (tens of microns) with a resolution that allows understanding the surface quality and modification is challenging. As a proof-of-principle, plasma-treated PET films were used to demonstrate the capabilities of X-ray ptychography, currently under development at the soft X-ray free-electron laser FLASH at DESY, for imaging macroscopic samples. In combination with scanning electron microscopy (SEM), this new technique was used to study the effects of different plasma treatment processes on PET plastic films. The studies on the surface morphology were complemented by investigations of the surface chemistry using X-ray photoelectron spectroscopy (XPS) and Fourier transform infrared spectroscopy (FT-IR). While both imaging techniques consistently showed an increase in roughness and change in morphology of the PET films after plasma treatment, X-ray ptychography can provide additional information on the three-dimensional morphology of the surface. At the same time, the chemical analysis shows an increase in the oxygen content and polarity of the surface without significant damage to the polymer, which is important for printing and coating processes.

show abstract

Characterization of the Percival detector with soft X-rays

Cited by 14 publications

References 16 publications

Single-shot experiments at the soft X-FEL FERMI using a back-side-illuminated scientific CMOS detector

Single-shot experiments at the soft X-FEL FERMI using a back-side-illuminated scientific CMOS detector

The PERCIVAL detector: first user experiments

X-ray Ptychographic Imaging and Spectroscopic Studies of Plasma-Treated Plastic Films

Contact Info

Product

Resources

About