Characterization of Edgeless CdTe Detectors for use in Hard X-Ray Imaging Applications

Veale, Matthew C.; Bell, Steven; Jones, Laurence; Seller, P.; Wilson, Matthew D.; Cernik, Robert J.; Kalliopuska, J.; Pohjonen, Helena; Andersson, H.; Nenonen, S.; Kachkanov, V.

doi:10.1109/tns.2012.2197025

Cited by 14 publications

(6 citation statements)

References 31 publications

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“…The pixels with poorer than average energy resolution are located in two distinct areas, within a few pixels of the physical edge of the crystal and in a diffuse cluster at the centre. The effect of the crystal edges on the detector response has been described in a previous study [26] while the source of the pixels with poor response at the centre of the device forms part of this investigation. The source of the poorer performance pixels at the centre of the detector is of interest as ideally 100 % of pixels would have the excellent energy resolution displayed by the majority of the pixels.…”

Section: Am Detector Characterisationmentioning

confidence: 99%

X-ray micro-beam characterization of a small pixel spectroscopic CdTe detector

et al. 2012

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A small pixel, spectroscopic, CdTe detector has been developed at the Rutherford Appleton Laboratory (RAL) for X-ray imaging applications. The detector consists of 80 × 80 pixels on a 250 µm pitch with 50 µm inter-pixel spacing. Measurements with an 241 Am γ-source demonstrated that 96% of all pixels have a FWHM of better than 1 keV while the majority of the remaining pixels have FWHM of less than 4 keV. Using the Diamond Light Source synchrotron, a 10 µm collimated beam of monochromatic 20 keV X-rays has been used to map the spatial variation in the detector response and the effects of charge sharing corrections on detector efficiency and resolution. The mapping measurements revealed the presence of inclusions in the detector and quantified their effect on the spectroscopic resolution of pixels.

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Section: Am Detector Characterisationmentioning

confidence: 99%

X-ray micro-beam characterization of a small pixel spectroscopic CdTe detector

et al. 2012

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“…Wafer sizes with 100 mm in diameter are commonly available, but crystals larger than 20 mm × 20 mm in size are still expensive [8], causing the crystal-ASIC package (also called hybrids) to be one of the most expensive parts of such an imaging device. Seamless hybrid detector technologies have been developed for larger crystals sizes [9] [10] and are typically done by using Through Silicon Via (TSV) technology to replace the wire bond I/Os of 3-side buttable devices. Fig.…”

mentioning

confidence: 99%

Characterization of Seamless CdTe Photon Counting X-Ray Detector

Kauppinen¹,

Winkler²,

Lämsä³

et al. 2021

IEEE Trans. Instrum. Meas.

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Spectrally selective X-ray imaging provides improved material and tissue discrimination in comparison to state-of-art dual energy technologies that are commonly used in medical, industrial, and security applications. Cadmium Telluride (CdTe) and Cadmium Zinc Telluride (CdZnTe) based line scanners and small size two-dimensional X-ray sensors are emerging to the market, but the need for large scale panels is axiomatic. In this study, a seamless CdTe tile was developed that enables the implementation of large-sized, energy selective X-ray detector panels. The developed tile consists of a 64 × 64 pixel array (with 150 µm pitch) with a necessary substrate, ASIC, and CdTe crystal. The performance of the constructed seamless tile was characterized by focusing on spectral resolution and stability. In addition, a simple pixel trimming method that automates the equalization of each energy selective pixel was developed and analyzed.The obtained results suggest that the proposed concept of seamless (tileable) detector structures is a feasible approach to scale up panel sizes. The seamless tile shows comparable spectral resolution and stability performance with commercial CdTe sensors. The effect of tile to tile variation, the realization of a largescale panel, as well as the charge sharing performance, were left out of the scope and are to be studied in the next phase.

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“…(width, height, thickness) is mounted onto a two-stage Peltier thermoelectric cooler that decreases the sensor temperature to reduce thermal noise and enables to increase voltage bias [9]. From the manufacturer portfolio, the detector with a CdTe sensor thickness of 1 mm is the most suitable for the spectrometry of medium energy X-ray photons in the energy range up to 300 keV [10].…”

Section: Jinst 17 P10002mentioning

confidence: 99%

“…Entrance window is made of beryllium alloy of 100 μm thickness. The topside and backside electrodes are made of thin layers of indium anode and platinum cathode producing the Schottky and Ohmic contacts, respectively [8][9][10][11]. The detector can be connected with the measuring computer directly via USB or Ethernet cables.…”

Section: Jinst 17 P10002mentioning

confidence: 99%

Practical X-ray beam spectrometry with cadmium telluride detector in 10–300 kVp range at Czech Metrology Institute. Part I. Instrumentation

Šolc

Dryák²,

Rusňák³

et al. 2022

J. Inst.

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The paper describes instrumentation used at Czech Metrology Institute for measurement of photon fluence spectra directly in X-ray beams. Detector with a cadmium telluride (CdTe) sensor was characterized by means of energy resolution and precise energy calibration. The hole trapping effect in CdTe causing full-energy peak deformations in measured spectra was adopted consisting of analytical models of incomplete charge collection and carrier trapping based on Hecht equation. The detector collimator provided by the manufacturer was modified with additional tungsten shielding that effectively absorbs the majority of photons scattered in the collimator body resulting in significant improvement of the consistency of measured and Monte Carlo simulated detector response. The purpose-made alignment platform increased the accuracy of orientation of the collimator axis improving the measurement in high photon fluence rate beams using collimation disks with very small apertures (down to 100 μm in diameter). The adopted instrumentation and methods for X-ray beam spectrometry enabled to fulfil the requirements of the new ISO 4037:2019-ed.2.0 standard for reference metrology laboratories. Software-focused part dealing with Monte Carlo simulations and procedures for photon fluence spectra unfolding is summarized in [1].

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Characterization of Edgeless CdTe Detectors for use in Hard X-Ray Imaging Applications

Cited by 14 publications

References 31 publications

X-ray micro-beam characterization of a small pixel spectroscopic CdTe detector

X-ray micro-beam characterization of a small pixel spectroscopic CdTe detector

Characterization of Seamless CdTe Photon Counting X-Ray Detector

Practical X-ray beam spectrometry with cadmium telluride detector in 10–300 kVp range at Czech Metrology Institute. Part I. Instrumentation

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