Characterization of Defects in Glasses and Coatings on Glasses by Microanalytical Techniques

Abstract

The most relevant defects in glasses and thin ®lms on glasses are categorized and investigated by the appropriate microanalytical techniques. Knots, which are local glassy inclusions, are described in greater detail. The combination of EPMA/EDX and LA-ICP-MS allow the determination of element concentrations in the defect down into the low ppm range, thus ®nally enabling the identi®cation of a special source of the defect from otherwise non distinguishable refractories. The results of analysis of stones and striae are reported and defect sources are discussed. Local defects in thin ®lms are characterized which can be explained by high intrinsic compressive stress in the ®lms. Typical glass and thin ®lm defects are used to illustrate the problem-solving process in industrial labs.

Observation of indentation-induced shear bands in a metal−organic framework glass

“…Here, it should be pointed out that the observed shear band is not a result of melt inhomogeneity, for the following reasons. Usually, one of the major types of inhomogeneous defects in bulk oxide glasses is striae due to an incomplete homogenization process (54). However, the size (length and width in macroscale) of the striae is significantly larger than that of the shear band (in nanoscale) shown in this work.…”

An approach to the reconstruction of true concentration profile from transient signal in spatially resolved analysis by means of laser ablation ICP MS

“…1 Compared with other analytical techniques suitable for microanalysis with similar figures of merit, e.g., glow dischargeoptical emission-mass spectrometry, secondary ion/neutral mass spectrometry, electron probe microanalysis, laser induced plasma emission spectrometry, particle-induced X-ray emission, and Auger-spectroscopy, LA-ICP-MS has numerous advantages, e.g., non-vacuum conditions, fastness, few restrictions concerning sample geometry, and a wide range of measurable concentrations. The ability to analyse both major and trace elements within a small area of the sample (10 2 -10 5 mm 2 ) as well as across large patterns (within cm range) is very important for the variety of applications of LA-ICP-MS in materials science, [1][2][3][4][5][6] mineralogy and geochemistry, [7][8][9][10][11][12] archaeology, 10,14 and biology. 15 Movable beam position regarding the sample surface allows to profile the lateral distribution of elements across the sample area.…”

P, S and Cl trace detection by laser ablation double-focusing sector field ICP-MS to identify local defects in coated glasses

“…9-14 However, studies on depth profiling analysis of coated glasses by LA-ICP-MS are still scarce 15,16 and few attempts have been done for the characterization of local defects in thin films. 17,18 In such cases, only major components of glass specimens (Na 2 O, Al 2 O 3 , SiO 2 , K 2 O, ZrO 2 and BaO) were investigated and the sources of defects were attributed to high intrinsic compressive stress in the thin films.…”