Characterization and Modeling of InGaP HBT Low-Frequency Oscillations

Burton, R.S.; Dai, Peter

doi:10.1109/ted.2004.829521

Cited by 3 publications

(2 citation statements)

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“…Electrothermally induced low-frequency spurious oscillations were reported previously for bipolar devices [17], [18] and explained on the basis of an interplay between slow electrical dynamics (e.g., a bias-tee capacitance) external to the device and the device thermal memory. On the other hand, in the present case, oscillations are related to an energy exchange among the different fingers of the device, as discussed further on.…”

Section: Circuit Interpretation Of Electrothermal Oscillationsmentioning

confidence: 82%

“…Since we are dealing with a linearized equivalent circuit, we can operate in the frequency domain expressing the small-signal dissipated power (approximated by a first-order Taylor expansion around the dc value) as a function of base current and temperature-rise phasors as (18) where . The relationship between the base-current variation entering each finger is given by…”

Section: Circuit Interpretation Of Electrothermal Oscillationsmentioning

confidence: 99%

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Assessment of Thermal Instabilities and Oscillations in Multifinger Heterojunction Bipolar Transistors Through a Harmonic-Balance-Based CAD-Oriented Dynamic Stability Analysis Technique

Traversa

Cappelluti

Bonani

et al. 2009

IEEE Trans. Microwave Theory Techn.

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We present a novel analysis of thermal instabilities and oscillations in multifinger heterojunction bipolar transistors (HBTs), based on a harmonic-balance computer-aided-design (CAD)-oriented approach to the dynamic stability assessment. The stability analysis is carried out in time-periodic dynamic conditions by calculating the Floquet multipliers of the limit cycle representing the HBT working point. Such a computation is performed directly in the frequency domain, on the basis of the Jacobian of the harmonic-balance problem yielding the limit cycle. The corresponding stability assessment is rigorous, and the efficient calculation method makes it readily implementable in CAD tools, thus allowing for circuit and device optimization. Results on three-and four-finger layouts are presented, including closed-form oscillation criteria for two-finger devices.

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Section: Circuit Interpretation Of Electrothermal Oscillationsmentioning

confidence: 82%

Section: Circuit Interpretation Of Electrothermal Oscillationsmentioning

confidence: 99%