2021
DOI: 10.1109/jxcdc.2021.3131144
|View full text |Cite
|
Sign up to set email alerts
|

Characterization and Modeling of 22 nm FDSOI Cryogenic RF CMOS

Abstract: Analog and RF mixed-signal cryogenic-CMOS circuits with ultra-high gain-bandwidth product can address a range of applications such as interface circuits between Superconducting Single-flux Quantum (SFQ) logic and cryo-DRAM memory, circuits for sensing and controlling qubits faster than their de-coherence time for at-scale quantum processor. In this work, we evaluate RF performance of 18nm gate length (LG) FDSOI NMOS and PMOS from 300K to 5.5K operating temperature. We experimentally demonstrate extrapolated pe… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
11
0

Year Published

2022
2022
2024
2024

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 19 publications
(16 citation statements)
references
References 25 publications
(23 reference statements)
0
11
0
Order By: Relevance
“…I D -V G curve 22 nm FDSOI MOSFET at 300 K (red) and 70 K (blue) for peripheral circuit modeling. [2] energy saving is 81%, 88%, and 87% for read, ERS, and PGM, respectively. Without the heat loss via the cable being considered, energy consumption of the SONS memory is slightly larger than that of the SONOS memory owing to the cooling power even though it is still advantageous in terms of latency.…”
Section: Simulations Toward Large-scale Systemmentioning
confidence: 99%
See 3 more Smart Citations
“…I D -V G curve 22 nm FDSOI MOSFET at 300 K (red) and 70 K (blue) for peripheral circuit modeling. [2] energy saving is 81%, 88%, and 87% for read, ERS, and PGM, respectively. Without the heat loss via the cable being considered, energy consumption of the SONS memory is slightly larger than that of the SONOS memory owing to the cooling power even though it is still advantageous in terms of latency.…”
Section: Simulations Toward Large-scale Systemmentioning
confidence: 99%
“…For the peripheral circuits modeling, models of a 22 nm Q8: fully-depleted silicon-on-insulator metal-oxide-semiconductor field-effect-transistor (FDSOI MOSFET) at 300 and 77 K (Figure 9) were used. [2] By updating the technology library with the cryogenic model, DESTINY, [12] a variant of NVSim [13] (the memory system-level simulation framework) was used to estimate energy and power consumption for an interface between a host processor and an SSD. To determine the number of cables and their physical parameters such as thermal conductivity and diameter, the Intel the open NAND flash interface (ONFI) 5.0 interface protocol and commercial coaxial cable data (Lake Shore Cryotronics) were referred in this simulation.…”
Section: Simulations Toward Large-scale Systemmentioning
confidence: 99%
See 2 more Smart Citations
“…To address such challenges, previous work [12] studied several on-chip microwave passive components at 4.2 K. Furthermore, [13] and [14] attempted to develop the small-signal equivalent circuit model of the FD-SOI devices at cryogenic temperatures, yet the transconductance and equivalent RC components were directly derived from the experimental values (i.e., which varied from device to device). Alternatively, a more general approach to build a cryo-CMOS RF compact model is by augmenting the intrinsic device compact model with external sub-circuit parasitic components [17].…”
Section: Introductionmentioning
confidence: 99%