1981
DOI: 10.1002/pssb.2221050203
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Characteristics of Secondary Electrons Ejected from Solid Targets by Multiply Charged Ions with Energy up to 20 MeV/Nucleon

Abstract: Detailed characteristics of secondary electron emission from silicon after bombardment by multiply charged ions Al, C, 0, Ca, Si, Fe with energies up to 20 MeV/nucleon are deduced from MonteCarlo simulations. The calculated integral yields 7 in forward direction to approach the 7-Zeff law. The discrepancies between calculated and experimental data for fission fragments are discussed. Limits for ion charge resolution by secondary particle counting are obt,ained.Ausfuhrliche Charakteristiken der Sekundarelektron… Show more

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Cited by 7 publications
(2 citation statements)
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“…We found this scaling law to hold up to (Fe), the maximal in our set of calculations. The distribution can be expressed as a simple power law, similar to that in [12] for (3) where Here, is in keV m , in MeV/amu and in m. and . , .…”
Section: Spatial Track Structurementioning
confidence: 99%
See 1 more Smart Citation
“…We found this scaling law to hold up to (Fe), the maximal in our set of calculations. The distribution can be expressed as a simple power law, similar to that in [12] for (3) where Here, is in keV m , in MeV/amu and in m. and . , .…”
Section: Spatial Track Structurementioning
confidence: 99%
“…Here, we present new calculations of the major characteristics of ion-and electron-interactions in silicon, using updated data (compared to those in [11], [12]) for the optical energy loss function (OELF). These results were then used to calculate the distribution of deposited energy losses around the ion track, yielding in particular the radial distribution .…”
Section: Introductionmentioning
confidence: 99%