Detailed characteristics of secondary electron emission from silicon after bombardment by multiply charged ions Al, C, 0, Ca, Si, Fe with energies up to 20 MeV/nucleon are deduced from MonteCarlo simulations. The calculated integral yields 7 in forward direction to approach the 7-Zeff law. The discrepancies between calculated and experimental data for fission fragments are discussed. Limits for ion charge resolution by secondary particle counting are obt,ained.Ausfuhrliche Charakteristiken der Sekundarelektronenemission von Silizium nach dem BeschuB mit vielfach geladenen Al-, C-, 0-, Ca-, Si-, Fe-Ionen mit Energien bis zu 20 MeV/Nukleon werden aus Monte-Carlo-Simulationen abgeleitet. Die berechneten Integralausbeuten 9 in Vorwiirtsrichtung niihern sich dem r]-Z,ff-Gesetz an. Die Differenzen zwischen berechneten und experimentellen Werten fur Spaltungsbruchstiicke werden diskutiert. Die Grenzen fur die Suflosung der Ionenladung durch Zahlen der Sekundiirteilchen werden aufgezeigt.
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