2013
DOI: 10.1088/1742-6596/425/21/212004
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Characterisation of CVD Diamond devices as XBPMs at SOLEIL

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Cited by 6 publications
(7 citation statements)
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“…7. Like the other diamond XBPMs made with electronic-grade single-crystal CVD (Desjardins et al, 2013), a potential of a few Volts (>0.2 V mm À1 ) is enough to reach constant XBIC values. Thereby, the flux can be easily calculated as equation (2).…”
Section: Flux and Intensity Monitoring Capabilitiesmentioning
confidence: 99%
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“…7. Like the other diamond XBPMs made with electronic-grade single-crystal CVD (Desjardins et al, 2013), a potential of a few Volts (>0.2 V mm À1 ) is enough to reach constant XBIC values. Thereby, the flux can be easily calculated as equation (2).…”
Section: Flux and Intensity Monitoring Capabilitiesmentioning
confidence: 99%
“…In addition to the excellent physical properties of diamond (radiation hardness, low X-ray absorption, mechanical resistance, large band gap, fast speed charge propagation, etc. ), this detector also has several other advantages compared with the classical quadrant XBPM design (Desjardins et al, 2013) or the strip detector (Shu et al, 1998: a very large active surface (usable with X-ray beams from millimetre to sub-micrometre ISSN 1600-5775 # 2018 International Union of Crystallography sizes), easier to calibrate, and a simplified fabrication process. i.e.…”
Section: Introductionmentioning
confidence: 99%
“…Such beamlines need fast diagnostics to precisely regulate the position of X-ray beam, where the beam stability is crucial for the success of experiments. In order to improve the performance of current beam diagnostics systems, Detector group of SOLEIL synchrotron and Diamond Sensors Laboratory (LCD) of CEA-LIST started in 2012 development of XBPMs based on single crystal chemical vapor deposited (scCVD) diamond [1]. A standardized production of 40-micrometer thick resistive electrode duo-lateral diamond Position-Sensitive Detectors (PSD) has been elaborated recently.…”
Section: Introductionmentioning
confidence: 99%
“…for X-ray, high-energy particle and heavyion detection (Bohon et al, 2010;Berdermann et al, 2010). Position sensitivity can be obtained by interpolation of the current signals measured from neighboring surface contacts, and submicrometer beam position noise has been demonstrated using both electrometer and radiofrequency readout approaches (Morse et al, 2010;Muller et al, 2012;Desjardins et al, 2013). This work has been carried out using scCVD plates of thicknesses from 500 mm down to $40 mm, which is the practical limit for abrasive thinning-polishing of this material, beyond which breakage of the plates during processing becomes increasingly likely.…”
Section: Introductionmentioning
confidence: 99%