2009
DOI: 10.1016/j.mseb.2008.10.034
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Cavities at the Si projected range by high dose and energy Si ion implantation in Si

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Cited by 2 publications
(2 citation statements)
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“…The importance of I trapping at microtwins is confirmed by considering that thermally unstable nanovoid formation in highly damaged amorphised (111) Si takes place even without He [12]. Conversely, XTEM observations of (100) samples that underwent the same processes except an additional shallow He + implantation (V-800),…”
Section: Discussionmentioning
confidence: 92%
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“…The importance of I trapping at microtwins is confirmed by considering that thermally unstable nanovoid formation in highly damaged amorphised (111) Si takes place even without He [12]. Conversely, XTEM observations of (100) samples that underwent the same processes except an additional shallow He + implantation (V-800),…”
Section: Discussionmentioning
confidence: 92%
“…They anneal out at temperatures higher than 800°C-900°C. V aggregation in thermally unstable clusters takes place even after high dose Si + or F + ion implantation without the stabilization of He [12,13].…”
Section: Introductionmentioning
confidence: 99%