The low‐temperature data of Hall‐effect measurements on p‐type InP doped with Cd, Zn, or Mg reported by Benzaquen et al., which exhibit the characteristic of nearest‐neighbor hoping conduction in an impurity band, have been analyzed within the two‐band model including the valence band and the impurity band. It is shown that the temperature‐dependent Hall‐effect data can be well fitted by assuming the hopping drift mobility expressed as μib = μib0(T0/T)3/2exp(−T0/T) and the hopping Hall factor expressed as Aib = (kBT/J)exp(−T0H/T) on the basis of a small‐polaron theory. Especially, Hall‐effect sign anomaly observed at low temperature in Mg‐doped InP is well reproduced by assuming a negative Hall effect for hoping conduction. The sign of the Hall coefficient for hoping conduction is discussed in connection with the overlap between the upper and the lower impurity Hubbard bands.