Carbon Nanotube Tips in Atomic Force Microscopy with Applications to Imaging in Liquid

Asis, Edward D. de; Leung, Joseph; Nguyen, Cattien V.

doi:10.1002/9783527649808.ch2

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2014

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“…Indeed, carbon nanotube tips are now important probes in atomic force microscopy [4][5][6]. They offer significantly improved image resolution and enable imaging of surfaces with deep crevices and trench structures [7][8][9].…”

Section: Introductionmentioning

confidence: 99%

Peeling of Long, Straight Carbon Nanotubes from Surfaces

Barker

Poggi

Lizárraga

et al. 2014

Journal of Nanotechnology

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The adhesion of long, straight, single-walled carbon nanotubes to surfaces is examined using multidimensional force spectroscopy. We observed characteristic signatures in the deflection and frequency response of the cantilever indicative of nanotube buckling and slip-stick motion as a result of compression and subsequent adhesion and peeling of the nanotube from the surface. The spring constant and the elastic modulus of the SWNT were estimated from the frequency shifts under tension. Using elastica modeling for postbuckled columns, we have determined the static coefficient of friction for the SWNT on alkanethiol-modified gold surfaces and showed that it varies with the identity of the monolayer terminal group.

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