Calibration and evaluation of scanning-force-microscopy probes

Abstract

It is demonstrated that a stepped (305) surface of a SrTi03 crystal can be used routinely to evaluate the probing profile of scanning-force-microscopy probes. This provides a means to select optimal surface probes, and to evaluate possible image distortions within the range of the atomic and nanometer scale. The scope and limitations of the resolution of structural defects are discussed as a criterion for a true atomic resolution.Scanning force microscopy (SFM), which is often also referred to as atomic force microscopy, ' currently is intensively used in various fields of material science in order to study surface interactions and surface structures. However, the image information often remains vague or ambiguous, due to the lack of insight of the actual imaging process.The resolution of a scanning microscope depends on the effective size of the probe which in the case of scanning force microscopy is determined by the probe

Measurement of interfacial shear (friction) with an ultrahigh vacuum atomic force microscope

“…Although these measurements are actually upper bounds to the tip dimensions, there was no substantial difference between tip images acquired on different ridges. This suggests, in combination with transmission electron microscopy ͑TEM͒ images of the SrTiO 3 ͑305͒ surface 27 and the high elastic modulus of SrTiO 3 , that the apparent dimensions are not grossly different from the true ones as the ridges are very sharp and rigid.…”

“…One useful surface for the purpose of tip imaging is the stepped SrTiO 3 ͑305͒ surface proposed by Sheiko et al 27 Once annealed, the surface terminates in a large number of ͑101͒ and ͑103͒ facets which form long sharp ridges that are suitable for tip imaging. Since the step density is high, acquired images contain many individual tip images which can be averaged to reduce the effect of noise and spurious surface features.…”

Lateral stiffness: A new nanomechanical measurement for the determination of shear strengths with friction force microscopy

“…We confirmed this tip to be parabolic using the sharp edges of a faceted SrTiO 3 ͑305͒ sample as described previously. 6,29 A certain value for k lever was assumed above. Methods to determine k lever if calibration uncertainties exist will be discussed elsewhere, along with detailed comments on error analysis and further measurements at other humidities and in ultrahigh vacuum ͑UHV͒.…”

Nanocluster formation by spin coating: Quantitative atomic force microscopy and Rutherford backscattering spectrometry analysis

“…However, in practice about 10% of these tips exhibit much sharper tip apexes, typically of the order of 10 nm or smaller. 21 This means that the AFM images are strongly influenced by the convolution of the surface structure with the tip structure. The extent of this convolution can be illustrated by using a simple graphical representation of the tip and surface.…”