1997
DOI: 10.1063/1.118639
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Lateral stiffness: A new nanomechanical measurement for the determination of shear strengths with friction force microscopy

Abstract: Carpick, Robert W.; Ogletree, D. F.; and Salmeron, Miguel, "Lateral stiffness: A new nanomechanical measurement for the determination of shear strengths with friction force microscopy" (1997). Departmental Papers (MEAM). 95.

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Cited by 409 publications
(302 citation statements)
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References 22 publications
(26 reference statements)
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“…8,19 The indentation depth z is obtained by integrating k contact obtained at different values F′ of the normal force:…”
Section: ∂F/∂dmentioning
confidence: 99%
“…8,19 The indentation depth z is obtained by integrating k contact obtained at different values F′ of the normal force:…”
Section: ∂F/∂dmentioning
confidence: 99%
“…Numerous experimental characterizations of the physical properties of nanoscale contacts have been performed by means of nanoindentation, [1][2][3][4] atomic force microscopy [5][6][7][8] and scanning tunneling microscopy ͑STM͒. 9,10 More recently, it has become recognized that a probe tip-quartz crystal microbalance ͑QCM͒ [11][12][13][14][15][16][17][18][19][20] or closely related geometries 21 could also have enormous potential as a sensitive probe of interfacial physical properties.…”
Section: Introductionmentioning
confidence: 99%
“…Unfortunately, during a friction force experiment contributions from the contact area and from the shear strength, are convoluted. 9,10 This is one of the reasons why even in wearless and single asperity contact experiments it is not trivial to relate friction forces to the Young modulus of the material investigated. 5 In this letter, we study sliding friction forces between a Si AFM tip and diamond, diamond-like carbon ͑DLC͒, and CrN thin films, i.e., materials used in industry as hard coatings.…”
mentioning
confidence: 99%