C-growth of d.c.-sputtered Mo and W thin films

Space-charge-limited currents in inhomogeneous thin-film insulators: numerical solutions

“…Differentiating the SCLC cases with uniform and non-uniform spatial trap distributions is a very important problem. As was shown earlier [9], it is possible to tell the difference between the two cases thanks to the analysis of the log(I/V 2 ) versus log L dependence, provided that T c /T differs from unity (T c is the so-called characteristic temperature [8]). In the case of shallow traps the thickness dependencies are usually very similar for the uniform and non-uniform trap distributions [8].…”

“…In our previous paper the solutions of the SCLC problem for deep traps were presented [9]. Equations (3), ( 5), ( 6) and ( 7) enable us to solve the problem for traps of any depth.…”

“…SCLC problem in dielectrics with a non-uniform trap distribution is treated in only a few papers [7][8][9]. The conclusions from the latter papers are as follows.…”

“…The spatial trap distribution at the electrode is assumed to be exponential (D describes this), while for the spatial trap concentration in the intergrain regions it is assumed that the drop of the trap concentration as a function of the distance from the electrodes is given by the gaussian distribution (σ is the standard deviation). D = 0.1 µm [9], σ = 0.1 µm [9], and x b = 3 µm. The value of x b gives the position of the intergrain region; it was obtained from electron micrographs of polycrystalline simple aromatic hydrocarbon films [10].…”

“…In most cases the analysis of SCL currents referred to the spatially uniform trap distribution in an insulator. There are very few papers referring to SCL currents in insulators with a non-uniform spatial trap distribution [7][8][9]. In this paper the problem of SCL currents in thin-film insulators with a non-uniform spatial trap distribution is discussed.…”