Broadband ZnO Single Nanowire Light Emitting Diode

Bao, Jinxiao; Zimmler, Mariano A.; Capasso, Federico; Wang, Xiaowei; Ren, Zhifeng

doi:10.1364/ipra.2006.iwd2

Cited by 56 publications

(67 citation statements)

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“…The EL curves of all the devices have the same general features, with the peak extending from 450 nm to beyond 900 nm and being centered at about 700 nm. This visible EL phenomenon is believed to be due to the defects and surface states of ZnO, in accordance with visible PL emission [18,19,22,24].…”

Section: Resultssupporting

confidence: 64%

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Wavelength-tunable infrared light emitting diode based on ordered ZnO nanowire/Si1–x Ge x alloy heterojunction

et al. 2015

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Section: Resultssupporting

confidence: 64%

“…ZnO/Si LED nanodevices have been studied widely, from single wire LEDs to nanowire or nanorod array LEDs [17][18][19][20][21][22][23][24][25]. However, most studies have focused on the electroluminescence (EL) emission of these devices in the visible range.…”

Section: Introductionmentioning

confidence: 99%

Wavelength-tunable infrared light emitting diode based on ordered ZnO nanowire/Si1–x Ge x alloy heterojunction

et al. 2015

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“…7 Also, optoelectronic applications of ZnO systems such as light-emitting diodes (LEDs), photo detectors, electroluminescence devices, solar cells, and ultraviolet lasers have recently attracted significant attention. 8,9 For the reason of several new applications of ZnO, there has been a great deal of interest in epitaxial ZnO thin films. 10 Fabrication of ZnO thin films can be achieved using different techniques, e.g., PVD (physical vapor deposition), 11 CVD (chemical vapor deposition), 12 metal organic CVD, 13 spray pyrolysis, 14 sputtering, 15 and sol-gel processing.…”

Section: Introductionmentioning

confidence: 99%

Zinc Oxide Thin Films Characterization, AFM, XRD and X-ray Reflectivity

2016

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In this study, surface structures of two zinc oxide (ZnO) thin films, prepared by sol-gel spin and dip-coating methods, were investigated. Ex situ Atomic Force Microscopy (AFM), X-ray diffraction (XRD), and X-ray reflectivity measurements were carried out in order to study the surface structure. XRD measurements showed nanostructured ZnO thin films with well-defined orientations. Fractal analysis was applied on the AFM data to illustrate the surface morphology of thin films. Fractal analysis provided a precious depiction of irregularities found in ZnO thin films and revealed that both interface width W and lateral correlation length ξ are strongly affected by coating method. Calculations showed that the film that was prepared by dip-coating had correlation length, interface width and fractal dimension of 56.2, 2.3, and 2.2 nm, respectively. These parameters for spin-coated sample were 354.8, 8.5, and 2.64 nm, respectively. Optimization of X-ray reflectivity by Genetic Algorithm optimization revealed structural parameters of thin films such as surface and interface roughness and thickness of the films. These calculations showed that dip-coated thin film has a smooth surface, whereas spin-coated thin film has a rough surface.

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“…It has also attracted attention for use in electrical and optical applications such as light emitting diodes, piezoelectric transducers and photocatalysts, etc. [1][2][3]. In recent years, the photocatalytic and antibacterial activities of ZnO particles have attracted interest for investigation [4].…”

Section: Introductionmentioning

confidence: 99%