Abstract:In this study, surface structures of two zinc oxide (ZnO) thin films, prepared by sol-gel spin and dip-coating methods, were investigated. Ex situ Atomic Force Microscopy (AFM), X-ray diffraction (XRD), and X-ray reflectivity measurements were carried out in order to study the surface structure. XRD measurements showed nanostructured ZnO thin films with well-defined orientations. Fractal analysis was applied on the AFM data to illustrate the surface morphology of thin films. Fractal analysis provided a preciou… Show more
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