1991
DOI: 10.1016/0038-1101(91)90081-9
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Bias circuit instabilities and their effect on the d.c. current-voltage characteristics of double-barrier resonant tunneling diodes

Abstract: Bias circuit stability has important implications for the study and application of double-barrier resonant tunneling structures. Stability criteria for resonant tunneling diodes are investigated for the common bias circuit topologies. A systematic study was made of the effect of different bias circuit elements on the measured d.c. I-V curves. A double-barrier diode was studied as an example, with experimental and theoretical results. The main results of the paper are (1) stable resonant tunneling diode operati… Show more

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Cited by 24 publications
(11 citation statements)
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“…However, by increasing the input voltage the mirrored load IV-curve is shifted to the right and at appropriate high input voltages we end up with three crossing points and, hence, three possible dc working points of the circuit. The middle crossing point in the NDR region is proven to be unstable as shown in detailed stability analysis including the dynamic behavior of the circuit (Kidner et al, 1991;Chow, 1964). For a stable working point the sum of load and driver conductivity G load , G driver has to be greater than zero, giving the stability criterion G load + G driver > 0, which is clearly violated in the NDR region.…”
Section: Digital Magneto Resistance In Magnetic Mobilesmentioning
confidence: 99%
“…However, by increasing the input voltage the mirrored load IV-curve is shifted to the right and at appropriate high input voltages we end up with three crossing points and, hence, three possible dc working points of the circuit. The middle crossing point in the NDR region is proven to be unstable as shown in detailed stability analysis including the dynamic behavior of the circuit (Kidner et al, 1991;Chow, 1964). For a stable working point the sum of load and driver conductivity G load , G driver has to be greater than zero, giving the stability criterion G load + G driver > 0, which is clearly violated in the NDR region.…”
Section: Digital Magneto Resistance In Magnetic Mobilesmentioning
confidence: 99%
“…Circuit stabilization is often simpler when R is sufficient to stabilize the circuit [10]. For power generation, however, it is important that positive resistances inside the rf circuit other than the rf load be minimized since the power lost to these resistances is Percent of power absorbed by (R + R3d) = (R3d±R) x 100% (6) For stabilization the ratio R/Rd should be just below 1 so that both inequalities of Eq. 5 can be satisfied.…”
Section: Parameters Effecting Stability and High Frequency Operationmentioning
confidence: 98%
“…al. [6] have experimentally demonstrated the nonlinearity of the device at 2.5 THz. This has led to the proposal of using these devices for very high frequency operation.…”
Section: Introductionmentioning
confidence: 96%
“…The depletion region around the gate wires, which extends into the resonant tunneling barrier structure, is illustrated in the lower left part of the figure. Also shown is the DC output from the GTD, the gate bias, V G , is changed in intervals of 0.5 V. The non ideal IV measured in the NDR region is due to bias network oscillations [11]. The arrows indicate how the device is operated as a pulse generator, as described in Section 4.…”
mentioning
confidence: 99%