2018
DOI: 10.1002/pssa.201800390
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Back Migration Based Long Lifetime Approach for Organic Light‐Emitting Diode

Abstract: Lifetime is one critical reliability issue in electronics, especially in organic devices including organic light emitting diodes (OLEDs), solar cells, thin film batteries, thin film transistors, and memories, etc. Many causes that contribute to device failures have been found out. So far, several methods for improvement in the device lifetime have been proposed, albeit effective approaches are still under developing and the ideal will be the one that enables cost-effective fabrication with ease of processing. … Show more

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Cited by 4 publications
(4 citation statements)
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References 33 publications
(28 reference statements)
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“…The oxidation of Ag at the anode into Ag + cations, which subsequently migrate through the electric field and are electrochemically reduced back to zerovalent metal when they come into contact with the cathode, is one proposed mechanism [115]. Some systems are mainly produced by momentum transfer from moving charge carriers to metal atoms, which are subsequently pushed forward by an "electron wind" or "hole wind" [116,117]. To distinguish it from electrochemical migration, this latter mechanism is called electromigration.…”
Section: Effects Of Electron Migration On Oledmentioning
confidence: 99%
“…The oxidation of Ag at the anode into Ag + cations, which subsequently migrate through the electric field and are electrochemically reduced back to zerovalent metal when they come into contact with the cathode, is one proposed mechanism [115]. Some systems are mainly produced by momentum transfer from moving charge carriers to metal atoms, which are subsequently pushed forward by an "electron wind" or "hole wind" [116,117]. To distinguish it from electrochemical migration, this latter mechanism is called electromigration.…”
Section: Effects Of Electron Migration On Oledmentioning
confidence: 99%
“…Similar to conventional OLEDs, UEN-based OLEDs also suffer from water and oxygen attack, electrochemical and photochemical reactions, electrical and thermal breakdown, etc. [170][171][172][173][174]. However, compared to conventional devices, UEN-based OLEDs may be more influenced by electron-induced molecule migration.…”
Section: Degradation Mechanisms Of Uen-based Oledsmentioning
confidence: 99%
“…In OLEDs, due to the continuous flow, electrons collide each other, which leads to molecular migration, resulting in the loss of device efficiency and a decrease in lifetime. [134,135] According to Shen et al mobile ions induced voltage changes, leading to device degradation. [136] According to Probst et al, if the metal/organic layer interaction is feeble in the interface, it will enhance the metal migration.…”
Section: Electron Induced Migrationsmentioning
confidence: 99%
“…In OLEDs, due to the continuous flow, electrons collide each other, which leads to molecular migration, resulting in the loss of device efficiency and a decrease in lifetime. [ 134,135 ] According to Shen et al. mobile ions induced voltage changes, leading to device degradation.…”
Section: Degradation Phenomena and Failure Mechanismsmentioning
confidence: 99%