Automation in Mixed-Signal Design: Challenges and Solutions in the Wake of the Nano Era

Abstract

The use of CMOS nanometer technologies at 65 nm and below will pose serious challenges on the design of mixed-signal integrated systems in the very near future. Rising design complexities, tightening time-to-market constraints, leakage power, increasing technology tolerances, and reducing supply voltages are key challenges that designers face. Novel types of devices, new process materials and new reliability issues are next on the horizon. We discuss new design methodologies and EDA tools that are being or need to be developed to address the problems of designing such mixed-signal integrated systems.

Automated synthesis of complex analog circuits

“…Fig. 2 shows a Caffeine-generated model for Cpk (process capability index) of a 50-transistor amplifier having 68 design variables [6]. This model can subsequently be used for manual or automatic yield optimization.…”