Automatic generation of autonomous built-in observability structures for analog circuits

Automatic generation of lightweight controllability and observability structures for analog circuits

“…The modeling of the defects is done at the schematic level with models used in literature [7] : the 5-fault model for the MOSFETs and the 6-fault model for the bipolar transistors. The application of these models on a circuit C 0 results in a list of faults LF={F 1 ,...,F n }.…”

“…The controllability is enhanced by using the Topology Modification method introduced in [5]. The observability is enhanced by using the Local Detection and Transmission Systems introduced in [7]. Their combination provides a simplification of the test infrastructure proposed by analog scan chains.…”

Non-intrusive detection of defects in mixed-signal integrated circuits using light activation

“…Mapping different analog performances into time-based parameters which can be probed out by a mixed-signal test bus has for example been proposed to measure analog specifications [4]. An automatic method based on injecting small detection blocks into less observable nodes has been proposed in [5]. Moreover, a non-intrusive sensor based approach has been proven to be successful in testing millimeter-wave circuits [6], [7].…”