Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization

Coyette, Anthony; Esen, Baris; Dobbelaere, Wim; Vanhooren, Ronny; Gielen, Georges

doi:10.1016/j.vlsi.2016.05.001

Cited by 11 publications

(11 citation statements)

References 18 publications

(18 reference statements)

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Our third idea was to use internal re-configuration. We used the topology modification approach proposed in [22]. The underlying idea is to connect Pull-Up (PU) PMOS and Pull- Down (PD) NMOS transistors that bring an internal node to VDD or ground, respectively.…”

Section: Resultsmentioning

confidence: 99%

BIST-Assisted Analog Fault Diagnosis

Pavlidis

Faehn

Louërat

et al. 2021

2021 IEEE European Test Symposium (ETS)

View full text Add to dashboard Cite

Fault diagnosis methodologies for analog circuits lag far behind those for their digital counterparts. In this paper, we show how the generic Symmetry-based Built-In Self-Test (BIST) (or SymBIST), originally proposed for defect-oriented postmanufacturing test and on-line test, can be seamlessly reused for the purpose of diagnosis. BIST can offer better insights into the circuit and, thereby, can assist diagnosis towards resolving ambiguity groups. Using SymBIST we demonstrate high diagnosis resolution and fast diagnosis cycle for an industrial Successive Approximation Register (SAR) Analog-to-Digital Converter (ADC).

show abstract

Section: Resultsmentioning

confidence: 99%

BIST-Assisted Analog Fault Diagnosis

Pavlidis

Faehn

Louërat

et al. 2021

2021 IEEE European Test Symposium (ETS)

View full text Add to dashboard Cite

show abstract

“…Examples of generic DfT techniques include oscillationbased testing [36], topology modification [37], and symmetrybased BIST [38]. In oscillation-based testing, the circuit is re-configured in a positive feedback loop to force oscillation.…”

Section: Dft For A/m-s and Rf Icsmentioning

confidence: 99%

“…We use a generic defect-oriented DfT technique proposed in [37]. The DfT principle is based on topology modification (or re-configuration) enabled by the addition of PD and PU transistors.…”

Section: B Dftmentioning

confidence: 99%

Digital-to-Analog Hardware Trojan Attacks

Elshamy

Natale

Sayed

et al. 2022

IEEE Trans. Circuits Syst. I

View full text Add to dashboard Cite

We propose a Hardware Trojan (HT) attack for analog circuits with its key characteristic being that it cannot be prevented or detected in the analog domain. The HT attack works in the context of Systems-on-Chip (SoCs) comprising both digital and analog Intellectual Property (IP) blocks. The attacker could be either the SoC integrator or the foundry. More specifically, the HT trigger is placed inside a dense digital IP block where it can be effectively hidden, whereas the HT payload is in the form of a digital pattern transported via the test bus or generated within the test bus, reaching the Design-for-Test (DfT) or programmability interface of the victim analog IP with the test bus. The HT payload unexpectedly activates the DfT and sets the victim analog IP into some possibly partial and undocumented test mode or changes the nominal programmability. The HT payload can be designed to result in performance degradation or complete malfunction, i.e., denial of service. We demonstrate this HT attack scenario on two analog IPs, namely a low-dropout (LDO) regulator using simulation and an RF receiver using hardware measurements.

show abstract

“…SymBIST is a generic BIST virtually applicable to any circuit class and is an one-off solution for two uses (a) and (c). For use (a), other generic BIST proposals include topology transformations by inserting pull-up or pull-down transistors [19] and oscillation-based test [20]. For use (c), generic BIST includes duplication or triple modular redundancy, but these approaches are very costly.…”

Section: Related Workmentioning

confidence: 99%

SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety

Pavlidis

Louërat

Faehn

et al. 2021

IEEE Trans. Circuits Syst. I

View full text Add to dashboard Cite

We propose a Built-In Self-Test (BIST) paradigm for analog and mixed-signal (A/M-S) Integrated Circuits (ICs), called symmetry-based BIST (SymBIST). SymBIST exploits inherent symmetries in an A/M-S IC to construct signals that are invariant by default, and subsequently checks those signals against a tolerance window. Violation of invariant properties points to the occurrence of a defect or abnormal operation. SymBIST is designed to serve as a functional safety mechanism. It is reusable ranging from post-manufacturing test, where it targets defect detection, to on-line test in the field of operation, where it targets low-latency detection of transient failures and degradation due to aging. We demonstrate SymBIST on a Successive Approximation Register (SAR) Analog-to-Digital Converter (ADC). SymBIST features high defect coverage, short test time, low overhead, zero performance penalty, and has a fully digital interface making it compatible with modern digital test access mechanisms. Index Terms-Analog and mixed-signal integrated circuit testing, built-in self-test, design-for-test, defect-oriented test, defect simulation, on-line test, concurrent error detection.

show abstract

Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization

Abstract: Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimizationVLSI, the integration, vol 55, p. 393-400.

Cited by 11 publications

References 18 publications

BIST-Assisted Analog Fault Diagnosis

BIST-Assisted Analog Fault Diagnosis

Digital-to-Analog Hardware Trojan Attacks

SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety

Contact Info

Product

Resources

About