Automated I–V measurement system for CMOS SOI transistor test structures

Automated Data Processing System for Oscilloscope Measurements during an Environmental Test

“…The Figure 2 shows the front panel of the program. The program allows the waveform to be saved as a png file (Figure 3), and, as seen on Figure 2, can be easily integrated as a functional unit of the test system [6][7][8][9][10][11][12], and allows us to work with the oscilloscope remotely, if necessary [13].…”

Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX

“…The complex designed can be used not only for MCU testing but also for wide range of electronics: microprocessors, analog ICS [7], optoelectronic devices [8], transistor test structures [9] and so on.…”

Functional and Parametrical Control of Temperature Sensors with the NI MyRIO Module

“…Usually the input control of the digital or analog integrated circuit is performed by automated systems or complexes of the functional and parametric control [9][10][11]. In this paper we describe the system of the parametrical and functional control for temperature sensor DS1624S+ [12].…”