2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278)
DOI: 10.1109/mwsym.2002.1011577
|View full text |Cite
|
Sign up to set email alerts
|

Augmented behavioral characterization for modeling the nonlinear response of power amplifiers

Abstract: ABSTRQCT -It is shown a simple extension of the conventional behavioral characterization of amplifier nonlinearity can be used to quantify power amplifier performance including many memory effects. External variables that influence the amplifier behavior (such as power supply voltage, input bias or temperature) are identified. Measurements of gain and phase (AM-AM and AM-PMconversion) are subsequently made over a range of these external variables. The variation of the external variables is explicitly taken int… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
9
0

Publication Types

Select...
3
2
2

Relationship

0
7

Authors

Journals

citations
Cited by 32 publications
(9 citation statements)
references
References 7 publications
0
9
0
Order By: Relevance
“…The drain voltage was swept from 1.5 to 6 V for ET design resulting in a three terminal nonlinear model. In case (2), the bare transistor model was converted into a load-dependent XP model, and the circuitry for bias and matching are embedded around the XP transistor model. The input power range and loads used for the XP extraction of the bare transistor are different from that of the whole PA.…”
Section: Simulation-based Xp Modelingmentioning
confidence: 99%
See 1 more Smart Citation
“…The drain voltage was swept from 1.5 to 6 V for ET design resulting in a three terminal nonlinear model. In case (2), the bare transistor model was converted into a load-dependent XP model, and the circuitry for bias and matching are embedded around the XP transistor model. The input power range and loads used for the XP extraction of the bare transistor are different from that of the whole PA.…”
Section: Simulation-based Xp Modelingmentioning
confidence: 99%
“…Nonlinear characterization and modeling of the transistor that can predict PA performance under varying bias and load is needed for more complex transmitters, such as those that employ envelope tracking [2]. A simplified ET block diagram is shown in Fig.…”
Section: Introductionmentioning
confidence: 99%
“…The overall input-output response of the system is given by Besides these linear memory effects, there are also some memory effects tightly coupled within the nonlinear circuits [28][29][30][31]. For example, thermal memory effects are caused by electro-thermal couplings.…”
Section: Memory Nonlinear Modelsmentioning
confidence: 99%
“…At each supply voltage, a power sweep was conducted and PAE and Gain were measured. Applying a simple model, as described in [13], the ET performance was estimated. The model had a linear relationship between input power and drain voltage.…”
Section: Envelope Trackingmentioning
confidence: 99%