2011
DOI: 10.1021/jp207612r
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Atomic Layer Deposition of Amorphous Niobium Carbide-Based Thin Film Superconductors

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Cited by 40 publications
(34 citation statements)
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“…These findings, when combined with the QCM and FTIR measurements, suggest that the TMA reduces the adsorbed MoOF x species to form AlF 3 and metallic Mo. In addition, the C and F presence in the films is similar to that in a previous study which concluded that alternating exposures to niobium pentafluoride and TMA produced films comprised of NbF x , NbC, C, and AlF 3 (12).…”
Section: Resultssupporting
confidence: 81%
“…These findings, when combined with the QCM and FTIR measurements, suggest that the TMA reduces the adsorbed MoOF x species to form AlF 3 and metallic Mo. In addition, the C and F presence in the films is similar to that in a previous study which concluded that alternating exposures to niobium pentafluoride and TMA produced films comprised of NbF x , NbC, C, and AlF 3 (12).…”
Section: Resultssupporting
confidence: 81%
“…These findings, when combined with the QCM and FTIR measurements, suggest that the TMA reduces the adsorbed MoOF x species to form AlF 3 and metallic Mo (11). In addition, the C and F presence in the films is similar to that in a previous study which concluded that alternating exposures to niobium pentafluoride and TMA produced films comprised of NbF x , NbC, C, and AlF 3 (13). XPS depth profiling of a 30%W:70% Al 2 O 3 film was performed and the results are shown in (Figure 5c).…”
Section: Resultssupporting
confidence: 79%
“…We utilized these nanocomposite coatings to functionalize capillary glass array plates to fabricate large-area MCPs suitable for application in large-area photodetectors (2,3,13). In addition, we have applied these films as charge drain coatings in MEMS devices for a prototype electron beam lithography tool, and obtained high resolution electron beam patterns without charging artifacts (11,14).…”
Section: Resultsmentioning
confidence: 99%
“…Jackson et al have attempted to combine the methods discussed above for the deposition of AlF3 by using TMA and TaF5 as precursors [145]. This approach is somewhat questionable, as it has been reported that combining TMA with metal halides generally leads to metal carbide deposition [178][179][180]. In addition, a similar ligand exchange reaction between TMA and TaF5, as was depicted in Equation (2), should produce pentamethyl tantalum which has been reported to be unstable [181,182].…”
Section: Ald Of Metal Fluorides Using Metal Fluorides As the Fluorinementioning
confidence: 99%