2019
DOI: 10.1002/cssc.201802383
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Atomic Force Microscopy Meets Biophysics, Bioengineering, Chemistry, and Materials Science

Abstract: Briefly, herein the use of atomic force microscopy (AFM) in the characterization of molecules and (bioengineered) materials related to chemistry, materials science, chemical engineering, and environmental science and biotechnology is reviewed. First, the basic operations of standard AFM, Kelvin probe force microscopy, electrochemical AFM, and tip‐enhanced Raman microscopy are described. Second, several applications of these techniques to the characterization of single molecules, polymers, biological membranes,… Show more

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Cited by 23 publications
(18 citation statements)
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“…As optical techniques have been important for the biological decoding of cellular processes, the study of mechanical properties has required the development of new techniques. Among these, atomic force microscopy (AFM) has been one of the most important [3,4,5,6]. AFM allows nondestructive measurements, together with good lateral resolution, in the natural setting of biological samples.…”
Section: Introductionmentioning
confidence: 99%
“…As optical techniques have been important for the biological decoding of cellular processes, the study of mechanical properties has required the development of new techniques. Among these, atomic force microscopy (AFM) has been one of the most important [3,4,5,6]. AFM allows nondestructive measurements, together with good lateral resolution, in the natural setting of biological samples.…”
Section: Introductionmentioning
confidence: 99%
“…Indeed, the atomic force microscopy is a well-recognized tool for nanoscale materials patterning and engineering, 48,49 just as much as for bioengineering, investigations in biochemistry and cell biology. 50,51 Inkjet printing is a cost-efficient nanofabrication method, especially for the labscale prototyping. 52,53 It typically operates with a picolitre droplet volume and 10-20 mm spatial resolution 52 of the droplet depositing.…”
Section: Discussionmentioning
confidence: 99%
“…Tuning of the tips was done automatically through instrument software (NanoScope version 8.15). Both topographic [14] and phase [24] images of 40 µm x 40 µm (1600 µm 2 ) scan areas were recorded. The root-mean-square (RMS) surface roughness was calculated as the standard deviation of all the height values within an image area using Nanoscope Analysis_v1.40 image processing software.…”
Section: Atomic Force Microscopy (Afm) Imaging and Surface Roughness mentioning
confidence: 99%
“…Lens polymers are often imaged by AFM in tapping mode, in which a cantilever tip oscillates at its natural resonance frequency and repeatedly contacts the surface for short increments of time as the cantilever is rastered over the analysis area. Toca-Herrera describes the technique in detail [14]. Briefly, the vibrating tip repeatedly nears, taps, and retreats from the surface, which changes the amplitude of vibration dependent upon surface topography.…”
Section: Introductionmentioning
confidence: 99%