Atomic Force Microscope-Based Nanorobotic System for Nanoassembly

Liu, Lianqing; Xi, Ning; Li, Guangyong; Chen, Heping

doi:10.1016/b978-1-4377-3471-3.00004-6

Cited by 2 publications

(2 citation statements)

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“…This operation both rescales and shifts the square pulse contribution by the frequency of the first harmonic. (19)…”

Section: (18)mentioning

confidence: 99%

“…In fact, C-AFM has been deliberately used as an imprinting tool in the past [17,18]. For the cases where the sample is rather delicate, intermittent-contact mode (ICM) imaging, where the tip and the sample interact briefly at the bottom of each cantilever oscillation, can be a less destructive technique [16,19,20], and this could be advantageous also for performing current measurements on such samples. Additionally, scanning tunnelling microscopy (STM) applications may also benefit from current measurements during which the tip oscillates above the surface, although in the noncontact regime.…”

Section: Introductionmentioning

confidence: 99%

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Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis

Uluutku

Solares

2020

Beilstein J. Nanotechnol.

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Atomic force microscopy (AFM) is an important tool for measuring a variety of nanoscale surface properties, such as topography, viscoelasticity, electrical potential and conductivity. Some of these properties are measured using contact methods (static contact or intermittent contact), while others are measured using noncontact methods. Some properties can be measured using different approaches. Conductivity, in particular, is mapped using the contact-mode method. However, this modality can be destructive to delicate samples, since it involves continuously dragging the cantilever tip on the surface during the raster scan, while a constant tip–sample force is applied. In this paper we discuss a possible approach to develop an intermittent-contact conductive AFM mode based on Fourier analysis, whereby the measured current response consists of higher harmonics of the cantilever oscillation frequency. Such an approach may enable the characterization of soft samples with less damage than contact-mode imaging. To explore its feasibility, we derive the analytical form of the tip–sample current that would be obtained for attractive (noncontact) and repulsive (intermittent-contact) dynamic AFM characterization, and compare it with results obtained from numerical simulations. Although significant instrumentation challenges are anticipated, the modelling results are promising and suggest that Fourier-based higher-harmonics current measurement may enable the development of a reliable intermittent-contact conductive AFM method.

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“…This operation both rescales and shifts the square pulse contribution by the frequency of the first harmonic. (19)…”

Section: (18)mentioning

confidence: 99%