2017
DOI: 10.3390/s17112652
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Assembled Cantilever Fiber Touch Trigger Probe for Three-Dimensional Measurement of Microstructures

Abstract: In this paper, an assembled cantilever fiber touch trigger probe was developed for three-dimensional measurements of clear microstructures. The probe consists of a shaft assembled vertically to an optical fiber cantilever and a probing sphere located at the free end of the shaft. The laser is emitted from the free end of the fiber cantilever and converges on the photosensitive surface of the camera through the lens. The position shift of the light spot centroid was used to detect the performance of the optical… Show more

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Cited by 5 publications
(3 citation statements)
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“…Thus, the hinge-typed microprobe system can perform various functions by combining MEMS and semiconductor technologies and developing a hinge mechanism. The use of the optical fiber has been proposed as a different approach [101][102][103][104][105][106][107][108][109][110][111][112][113]. Figure 5 shows some of the examples.…”
Section: Contact Probing System With Hinge Structurementioning
confidence: 99%
See 1 more Smart Citation
“…Thus, the hinge-typed microprobe system can perform various functions by combining MEMS and semiconductor technologies and developing a hinge mechanism. The use of the optical fiber has been proposed as a different approach [101][102][103][104][105][106][107][108][109][110][111][112][113]. Figure 5 shows some of the examples.…”
Section: Contact Probing System With Hinge Structurementioning
confidence: 99%
“…For using an optical fiber, the contact of the probe tip to the measured surface is detected by measuring the deflection of the optical fiber stem using the optical method; furthermore, high resolutions are expected for this detection. The probe deflection can be measured with high resolution; however, the reproducibility of detection is difficult to The use of the optical fiber has been proposed as a different approach [101][102][103][104][105][106][107][108][109][110][111][112][113]. Figure 5 shows some of the examples.…”
Section: Contact Probing System With Hinge Structurementioning
confidence: 99%
“…However, it is extremely difficult to accurately measure microstructures such as micrometer-order small holes and grooves with a high aspect ratio. Various microstructure measurement system based on different principles have been proposed [4][5][6][7][8][9][10][11][12][13][14][15].…”
Section: Introductionmentioning
confidence: 99%