Applying a conventional VNA to nonlinear measurements without using frequency converting standards

Abstract

A novel approach is presented for a measurement system which is able to investigate the most relevant specifications of microwave circuits and components. This unique test stand is configured for on wafer measurements up to 60 GHz, but can also be used for connectorized device measurements. The main measurement capabilities of the system are: Two and three port scattering parameters, noise figure and noise parameters of two port devices, power and gain measurements including harmonic power and harmonic impedances, all mixer parameters including conversion noise and the cornplete conversion matrix, active load pulling and the spectrum and phase noise of oscillators Furthermore, a new calibration method has been developed which allows the measurement of absolute values of up to three port power waves at the device under test without fiequericy converting standards in the calibration.The system operates in combination w i t h an automatic wafer probe station. In the future the control software for the prober will be integrated in the measurement system software giving the capability of performing wafer mapping of MMIC's e.g.. I . System Description;Fig. 1. IMST combined load pull, mixer and oscillator and S-,parameter measurement stand

Recent developments in nonlinear network design: Overview of integrated nonlinear microwave and millimeter-wave circuits workshop

“…The vector measurement capability of the microwave transition analyzer is utilized, allowing full vector calibration of the measurement system for the fundamental and higher harmonics. Again in 1994, Roth et al presented a novel approach for a measurement system to experimentally investigate the most relevant technical specifications of microwave circuits operating in combination with an automatic wafer probe station [111].…”