Absolute Magnitude and Phase Calibrations

Remley, Kate A.; Hale, Paul D.; Williams, Dylan F.

doi:10.1201/9781420006704.ch4

Cited by 3 publications

(2 citation statements)

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“…The calibration of waveform recorders (e.g., oscilloscopes) requires the utilization of well characterized (i.e., reference) signals at their input in order to obtain an accurate estimation of their frequency response [1]. According to the chosen type of reference signal, the utilized techniques, which are available in the literature, can be classified as [2]: (i) pulse-based and (ii) swept-frequency based. The former one takes the advantage of frequency combs and multisine signals, however, it exhibits low accuracy in the estimation of the phase response at high frequencies (e.g., GHz range).…”

Section: Introductionmentioning

confidence: 99%

An electro-optic system implementing an accurate phase measurement method for sinewave signals

Vito¹,

Picariello²,

Rapuano³

et al. 2022

Proceedings of the 25th IMEKO TC4 International Symposium and 23rd International Workshop on ADC and DAC Modelling and Testing

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This paper deals with a preliminary design of an electro-optic system for accurately measuring the phase of sinewave signals output by generators up to 100MHz. In particular, a short description of the measurement method and an envisioned application, namely the characterization of waveform recorders, is provided. In the paper, an initial selection of the commercially-available instruments, which are suitable for implementing the proposed electro-optic system and the chosen specifications, are shown. To estimate the repeatability of the phase measurements according to the main characteristics of the chosen equipment, a simulator was implemented and its description is available in the paper. According to the simulation, a maximum standard deviation of 0.028 • can be achieved at 100 MHz.

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Section: Introductionmentioning

confidence: 99%

An electro-optic system implementing an accurate phase measurement method for sinewave signals

Vito¹,

Picariello²,

Rapuano³

et al. 2022

Proceedings of the 25th IMEKO TC4 International Symposium and 23rd International Workshop on ADC and DAC Modelling and Testing

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“…We are grateful to Dylan Williams and Paul Hale of NIST for collaborations on oscilloscope measurement methods, including the creation of Figure 8 and the work in [4], and to Dominique Schreurs and Maciej Myslinski of the K.U. Leuven for collaborations on nonlinear device measurements and models, including the work presented in Example 2.…”

Section: Acknowledgementmentioning

confidence: 99%

Practical applications of nonlinear measurements

Remley¹

2009

2009 73rd ARFTG Microwave Measurement Conference

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We contrast linear, VNA-based measurements, involving ratios of the magnitude and phase of individual frequency components, to measurements of nonlinear devices and circuits, where the relative phase between frequency components and the actual impedance in which a device is embedded are important. The architectures and calibration techniques for several types of instruments designed to satisfy these requirements are presented and compared. Examples of the use of these instruments for measurement and model development of nonlinear circuits are presented.

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