2015
DOI: 10.1063/1.4906976
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Antireflective downconversion ZnO:Er3+,Yb3+ thin film for Si solar cell applications

Abstract: Hexagonal wurtzite phased ZnO:Er3+/Yb3+ thin films with various Yb concentrations were deposited on Si(111) substrate by Aerosol Assisted Chemical Vapor Deposition process. Post-annealed films at 1000 °C in air atmosphere showed a crystallinity enhancement. Yb3+ (4F7/2 → 4F5/2) 1000 nm emission increased with the increase of Yb3+ concentration emanating from an Er-Yb energy transfer. The reflectance percentage of 12% was achieved in the [250–1000 nm] range, and the refractive index of 1.97 was obtained for 632… Show more

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Cited by 24 publications
(22 citation statements)
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“…In addition, it can be seen that the sample's mean grain size D determined by the Debye-Scherrer method from the (002) films are in a uniform state of stress with the tensile components parallel to c-axis [34], which is attributed to the larger ionic radius of Nd 3+ (0.108 nm) compared to the Zn 2+ ion (0.074 nm). This radius mismatching increases the lattice constants "a" and "c", implying a unit cell expansion in ZnO:Nd 3+ films [26]. Regarding the XRD patterns in Fig.3a, only "c" parameter M A N U S C R I P T…”
Section: Structural Studymentioning
confidence: 97%
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“…In addition, it can be seen that the sample's mean grain size D determined by the Debye-Scherrer method from the (002) films are in a uniform state of stress with the tensile components parallel to c-axis [34], which is attributed to the larger ionic radius of Nd 3+ (0.108 nm) compared to the Zn 2+ ion (0.074 nm). This radius mismatching increases the lattice constants "a" and "c", implying a unit cell expansion in ZnO:Nd 3+ films [26]. Regarding the XRD patterns in Fig.3a, only "c" parameter M A N U S C R I P T…”
Section: Structural Studymentioning
confidence: 97%
“…It is renowned that the deposition temperature is the key parameter for both incorporation of the dopant and deposition process of the films [26,30,31]. To study the deposition processes of Nd doped ZnO thin films, we have investigated the growth rate versus deposition temperature.…”
Section: Growth Ratementioning
confidence: 99%
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