Effect of film thickness on structural, morphology, dielectric and electrical properties of parylene C films J. Appl. Phys. 112, 064103 (2012) Polymer film deposition on agar using a dielectric barrier discharge jet and its bacterial growth inhibition Appl. Phys. Lett. 101, 074107 (2012) In-situ characterization of free-volume holes in polymer thin films under controlled humidity conditions with an atmospheric positron probe microanalyzer Appl. Phys. Lett. 101, 014102 (2012) Tailoring electrically induced properties by stretching relaxor polymer films J. Appl. Phys. 111, 083515 (2012) Global and local planarization of surface roughness by chemical vapor deposition of organosilicon polymer for barrier applications J. Appl. Phys. 111, 073516 (2012) Additional information on J. Appl. Phys. Hydrogen (H) stability in hydrogenated amorphous carbon (a-C:H) films with different structures grown by (biased) electron-cyclotron-resonance chemical vapor deposition has been studied against thermal annealing and swift-ion impact (2 MeV He þ ). For this purpose, a-C:H films with either polymer-like (PLCH) or diamond-like (DLCH) character grown on grounded or biased (À200 V) substrates, respectively, were annealed up to 450 C. The local-order structural evolution around C sites was analyzed by x-ray absorption near-edge spectroscopy (XANES) and the H content and radiation-induced release were determined by successive elastic recoil detection analysis (ERDA) acquisitions. A relatively high H content is measured for both asgrown PLCH ($45 at. %) and DLCH films ($33 at. %). Upon annealing, PLCH films suffer thermal-induced surface decomposition resulting in a thickness reduction and only above 350 C the H content in the film matrix decreases. PLCH films also display a pronounced H loss rate during ERDA measurements, whereas H is stable in DLCH. These results indicate that H bonding differs in both structures (i.e., weaker C-H bonds in PLCH). XANES shows that upon annealing both structures suffer H loss at the near surface region together with a graphitization process, although the impact is more pronounced in PLCH. XANES fine-structure reveals that aromatic clusters are formed upon annealing in PLCH due to H loss, whereas this process is partially inhibited in DLCH due to the thermal stability of the C-H bonds. V C 2012 American Institute of Physics. [http://dx